Testing and Debugging Quantum Circuits
Uloženo v:
| Vydáno v: | IEEE Transactions on Quantum Engineering Ročník 5; s. 1 - 15 |
|---|---|
| Hlavní autoři: | , |
| Médium: | Journal Article |
| Jazyk: | japonština |
| Vydáno: |
Institute of Electrical and Electronics Engineers (IEEE)
01.01.2024
|
| Témata: | |
| ISSN: | 2689-1808 |
| On-line přístup: | Získat plný text |
| Tagy: |
Přidat tag
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
|
| Author | Sara Ayman Metwalli Rodney Van Meter |
|---|---|
| Author_xml | – sequence: 1 orcidid: 0000-0002-9874-2306 fullname: Sara Ayman Metwalli – sequence: 2 orcidid: 0000-0002-5044-9514 fullname: Rodney Van Meter |
| BackLink | https://cir.nii.ac.jp/crid/1872835442732527616$$DView record in CiNii |
| BookMark | eNotjM1KxDAURoMoOI7zAO66EHet9978dinVUWFAhO4lvUlKBo0wbcXH10E33-EsznchTstniUJcITTKaQ23_vCdvxqSiA06AjoRKzKurdGBOxebadoDAGlEA7QSN32c5lzGypdQ3cdhGcejvS6-zMtH1eUDL3meLsVZ8u9T3PxzLfrtQ9891buXx-fublfvW21q6dh5qQL41PowgG01sAyaCawKrIkZOYEhNhb8EHyIUQUnk0waf2O5Ftd_tyXnN87HRWfJSa0UWUmarEEjfwDLeEGl |
| ContentType | Journal Article |
| DBID | RYH |
| DOI | 10.48550/arxiv.2311.18202 10.1109/tqe.2024.3374879 |
| DatabaseName | CiNii Complete |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Physics |
| EISSN | 2689-1808 |
| EndPage | 15 |
| GroupedDBID | 0R~ AAFWJ ABAZT ABJNI ABVLG AFPKN ALMA_UNASSIGNED_HOLDINGS BEFXN BFFAM BGNUA BKEBE BPEOZ EBS ESBDL GROUPED_DOAJ IEDLZ JAVBF M~E OCL OK1 RYH |
| ID | FETCH-LOGICAL-j956-38c8a34d0af9adb07950c3d5c2074dc52cc1cf062c670abdadee4d83f3f5138c3 |
| IngestDate | Mon Nov 10 09:09:32 EST 2025 |
| IsDoiOpenAccess | true |
| IsOpenAccess | true |
| IsPeerReviewed | true |
| IsScholarly | true |
| Language | Japanese |
| LinkModel | OpenURL |
| MergedId | FETCHMERGED-LOGICAL-j956-38c8a34d0af9adb07950c3d5c2074dc52cc1cf062c670abdadee4d83f3f5138c3 |
| ORCID | 0000-0002-9874-2306 0000-0002-5044-9514 |
| OpenAccessLink | http://dx.doi.org/10.48550/arxiv.2311.18202 |
| PageCount | 15 |
| ParticipantIDs | nii_cinii_1872835442732527616 |
| PublicationCentury | 2000 |
| PublicationDate | 2024-01-01 |
| PublicationDateYYYYMMDD | 2024-01-01 |
| PublicationDate_xml | – month: 01 year: 2024 text: 2024-01-01 day: 01 |
| PublicationDecade | 2020 |
| PublicationTitle | IEEE Transactions on Quantum Engineering |
| PublicationYear | 2024 |
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| Publisher_xml | – name: Institute of Electrical and Electronics Engineers (IEEE) |
| SSID | ssj0002511602 ssib042470376 |
| Score | 2.3638718 |
| SourceID | nii |
| SourceType | Publisher |
| StartPage | 1 |
| SubjectTerms | Atomic physics. Constitution and properties of matter Debugging FOS: Physical sciences Materials of engineering and construction. Mechanics of materials QC170-197 Quantum Physics Quantum Physics (quant-ph) quantum programs quantum software TA401-492 testing |
| Title | Testing and Debugging Quantum Circuits |
| URI | https://cir.nii.ac.jp/crid/1872835442732527616 |
| Volume | 5 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVAON databaseName: Open Access: DOAJ - Directory of Open Access Journals databaseCode: DOA dateStart: 20200101 customDbUrl: isFulltext: true eissn: 2689-1808 dateEnd: 99991231 titleUrlDefault: https://www.doaj.org/ omitProxy: false ssIdentifier: ssj0002511602 providerName: Directory of Open Access Journals – providerCode: PRVHPJ databaseName: ROAD: Directory of Open Access Scholarly Resources databaseCode: M~E dateStart: 20200101 customDbUrl: isFulltext: true eissn: 2689-1808 dateEnd: 99991231 titleUrlDefault: https://road.issn.org omitProxy: false ssIdentifier: ssj0002511602 providerName: ISSN International Centre |
| link | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwtV3fT9UwFG4QNfHFoGhQgezB-EJ2Wbv-fCTkEh6EYHJDeDNd25kRmLp7h9cX_nZOu27MGxL1gZdmWdOm6zn7enp6-h2EPmKH86J0NNVSiJRiS9LCCQdgaGHDVRBtQtK-88_i9FReXKizGD8_D-kERF3L5VL9eFRRwzsQtr86-x_iHjqFF_AMQocSxA7lvwne82bEm4eAJu23kIboSwtT2F7vHVaNaauOvqk3Sv2Gr2M57245hBOEvsGIsHDwxuhG7x38vg7nPItf-uqquj-3sTWgzHlXFSN_o1OB0BWnwh-BCtOQj2fgLpgO6XnmwxCCg9gPtndfuIBghEuVYpnJMdyyEVzi0brb3epcRfRAuObXq2ZZ3UzAGMUTTzlPHkb_QJ66-OnpTwmd5J5aR6gn6CkRTPl4v5PbaQ82lFAAu2iL-WXb77W4j_bail3tr3bUHYqHEe2vjgdMk7qqRqbJbAO9jHuK5KDThVdo7VK_Rs9DbK-Zb6JPUSMSmNdk0IgkCjjpNeINmh1NZ4fHaUyPkV568shcGqlzajNdKm2LTCiWmdwyQ8AqtIYRY7ApM04MF5kurLbOUSvzMi8Zhsb5W7Ref6_dFkoc58w5xYXGJTWWgclMoSsFfzfVuFDv0A583FdT-RJL4Tn6KAXDlzAiOObv_1L_Ab24V7JttL5oWreDnpmbRTVvdoMbZDcI5w47z0cs |
| linkProvider | ISSN International Centre |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Testing+and+Debugging+Quantum+Circuits&rft.jtitle=IEEE+Transactions+on+Quantum+Engineering&rft.au=Sara+Ayman+Metwalli&rft.au=Rodney+Van+Meter&rft.date=2024-01-01&rft.pub=Institute+of+Electrical+and+Electronics+Engineers+%28IEEE%29&rft.eissn=2689-1808&rft.volume=5&rft.spage=1&rft.epage=15&rft_id=info:doi/10.48550%2Farxiv.2311.18202&rft_id=info:doi/10.1109%2Ftqe.2024.3374879 |