Revolutionizing Software Defect Prediction Through Deep Learning
This study aims to revolutionize software defect prediction by leveraging deep learning (DL) techniques, specifically focusing on Convolutional Neural Networks (CNN) and Stack Sparse Autoencoders (SSAE). The research involves training these models on datasets from the NASA Metrics Data Program, usin...
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| Published in: | 2024 7th International Conference on Circuit Power and Computing Technologies (ICCPCT) Vol. 1; pp. 438 - 442 |
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| Main Authors: | , |
| Format: | Conference Proceeding |
| Language: | English |
| Published: |
IEEE
08.08.2024
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| Subjects: | |
| Online Access: | Get full text |
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