Citace podle APA (7th ed.)

G, S. J., & Charles, J. (2024). Revolutionizing Software Defect Prediction Through Deep Learning. 2024 7th International Conference on Circuit Power and Computing Technologies (ICCPCT), 1, 438-442. https://doi.org/10.1109/ICCPCT61902.2024.10673411

Citace podle Chicago (17th ed.)

G, Selvin Jose, a J. Charles. "Revolutionizing Software Defect Prediction Through Deep Learning." 2024 7th International Conference on Circuit Power and Computing Technologies (ICCPCT) 1 (2024): 438-442. https://doi.org/10.1109/ICCPCT61902.2024.10673411.

Citace podle MLA (9th ed.)

G, Selvin Jose, a J. Charles. "Revolutionizing Software Defect Prediction Through Deep Learning." 2024 7th International Conference on Circuit Power and Computing Technologies (ICCPCT), vol. 1, 2024, pp. 438-442, https://doi.org/10.1109/ICCPCT61902.2024.10673411.

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