Impact of Software Optimization on Variable Lifetimes in a Microprocessor-Based System

Assessing and improving the level of system robustness with respect to soft errors has become one of the main design challenges, especially when designing critical embedded systems. In systems using microprocessors (e.g. most of SoCs) the system dependability is strongly correlated with the variable...

Celý popis

Uložené v:
Podrobná bibliografia
Vydané v:2011 IEEE 6th International Workshop on Electronic Design, Test and Application s. 56 - 61
Hlavní autori: Bergaoui, S, Leveugle, R
Médium: Konferenčný príspevok..
Jazyk:English
Vydavateľské údaje: IEEE 01.01.2011
Predmet:
Benchmark testing
Critical variables
Measurement
microprocessor-based systems
Optimization
Registers
Resource management
Robustness
Software
Software Optimizations
Variable lifetimes
ISBN:9781424493579, 1424493579
On-line prístup:Získať plný text
Tagy: Pridať tag
Žiadne tagy, Buďte prvý, kto otaguje tento záznam!
Abstract Assessing and improving the level of system robustness with respect to soft errors has become one of the main design challenges, especially when designing critical embedded systems. In systems using microprocessors (e.g. most of SoCs) the system dependability is strongly correlated with the variable lifetimes. In this paper, we discuss the impact of compilation optimizations on the lifetimes in both memory blocks and internal processor registers. Evaluations on many significant examples show that specific optimization options are required when the reliability is more important than execution time or code size.
AbstractList Assessing and improving the level of system robustness with respect to soft errors has become one of the main design challenges, especially when designing critical embedded systems. In systems using microprocessors (e.g. most of SoCs) the system dependability is strongly correlated with the variable lifetimes. In this paper, we discuss the impact of compilation optimizations on the lifetimes in both memory blocks and internal processor registers. Evaluations on many significant examples show that specific optimization options are required when the reliability is more important than execution time or code size.
Author Bergaoui, S
Leveugle, R
Author_xml – sequence: 1
  givenname: S
  surname: Bergaoui
  fullname: Bergaoui, S
  email: Salma.Bergaoui@imag.fr
  organization: TIMA Lab., UJF, Grenoble, France
– sequence: 2
  givenname: R
  surname: Leveugle
  fullname: Leveugle, R
  email: Regis.Leveugle@imag.fr
  organization: TIMA Lab., UJF, Grenoble, France
BookMark eNotj89LwzAcxSMq6GaPnrzkH-hM0vxojnNOHVR2WNl1JOk3EFmbkhRk_vUW9PF4n8ODB2-BboY4AEKPlKwoJfr5ddu06xUjlM5xhRZESS14RaS4RoVWNeWMc10Jpe9QkfMXmSWYUprco-OuH42bcPT4EP30bRLg_TiFPvyYKcQBzz6aFIw9A26Ch7mCjMOADf4MLsUxRQc5x1S-mAwdPlzyBP0DuvXmnKH45xK1b9t281E2-_fdZt2UQZOpBOhqS3WtJQglayqkdMAcUdZ4apzqwDklwHeSUasMF9ZLwa3Qta1UZXW1RE9_swEATmMKvUmXk1Bs_k-qX5UJU-E
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/DELTA.2011.20
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Xplore POP ALL
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE/IET Electronic Library (IEL) (UW System Shared)
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
EISBN 0769543065
9780769543062
EndPage 61
ExternalDocumentID 5729540
Genre orig-research
GroupedDBID 6IE
6IF
6IK
6IL
6IN
AAJGR
AAWTH
ADFMO
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
IEGSK
IERZE
OCL
RIE
RIL
ID FETCH-LOGICAL-i90t-eed8b19896e57681566ce2c07baf1ac7decc75efd621b7a45bf654b598b373b93
IEDL.DBID RIE
ISBN 9781424493579
1424493579
IngestDate Wed Aug 27 02:40:42 EDT 2025
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i90t-eed8b19896e57681566ce2c07baf1ac7decc75efd621b7a45bf654b598b373b93
PageCount 6
ParticipantIDs ieee_primary_5729540
PublicationCentury 2000
PublicationDate 2011-Jan.
PublicationDateYYYYMMDD 2011-01-01
PublicationDate_xml – month: 01
  year: 2011
  text: 2011-Jan.
PublicationDecade 2010
PublicationTitle 2011 IEEE 6th International Workshop on Electronic Design, Test and Application
PublicationTitleAbbrev delta
PublicationYear 2011
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0000527790
ssib026766303
Score 1.4702466
Snippet Assessing and improving the level of system robustness with respect to soft errors has become one of the main design challenges, especially when designing...
SourceID ieee
SourceType Publisher
StartPage 56
SubjectTerms Benchmark testing
Critical variables
Measurement
microprocessor-based systems
Optimization
Registers
Resource management
Robustness
Software
Software Optimizations
Variable lifetimes
Title Impact of Software Optimization on Variable Lifetimes in a Microprocessor-Based System
URI https://ieeexplore.ieee.org/document/5729540
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV09T8MwELVKxcAEqEV8ywMjhtSO43jkqwKplEpUVbfKdi5SBpIqtPD38UfSMrAgeUiyOPKLfHm-e-8QuspiGGgRK0KFkCQGaojkKiL2zwAkzxIjUy8UHonxOJ3P5aSDrjdaGADwxWdw4y59Lj-rzNodlVny7rJSlqDvCCGCVqv9dmgibOxsMorB19vNHrVaLsm4kK3FU3u_9dy8fXwaTe-Co6dr_f2r04oPNMP9_73iAepvFXt4solFh6gDZQ_NXrwEElc5fre77beqAb_ZLeKj0V5iO2aWKzv1FB4VOfhG87goscKvrlBvGVQEVU3ubbDLcLA376Pp8Gn68EyaPgqkkNGK2JlT7UqjEnDkwhE2YzGJhFb5QBmRWRQtMnmWUAubirnOEx5rLlPNBNOSHaFuWZVwjHDOUzBMUZakMtYDoWNOtYyU80diFPgJ6rklWSyDU8aiWY3Tvx-fob1wQuvGOequ6jVcoF3ztSo-60sP7w_blaGL
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV09T8MwELWqggQToBbxjQdGDIljx_HIV9WKtFQiqrpVdnKRMpBUoYW_j52PloEFyUOSxZFf5Mvz3XuH0E3CwNWCKUKFkIQBjYnkyiHmzwAkT_xYBpVQOBSTSTCfy2kH3W60MABQFZ_Bnb2scvlJEa_tUZkh7zYrZQj6DmeMurVaq_16qC9M9GxyirWzt53fadVc0uNCtiZP7f3WdfP--SWMHmpPT9v8-1evlSrUDA7-95KHqL_V7OHpJhodoQ7kPTQbVSJIXKT43ey336oE_GY2iY9GfYnNmBm2bPVTOMxSqFrN4yzHCo9tqd6y1hEUJXk04S7BtcF5H0WDl-hpSJpOCiSTzoqYmQNti6N8sPTCUrbYoOIIrVJXxSIxOBps0sSnBjjFuE59zjSXgfaEp6V3jLp5kcMJwikPIPYU9fxAMu0KzTjV0lHWIcmjwE9Rzy7JYll7ZSya1Tj7-_E12htG43ARjiav52i_Pq-14wJ1V-UaLtFu_LXKPsurCuofdwek0g
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2011+IEEE+6th+International+Workshop+on+Electronic+Design%2C+Test+and+Application&rft.atitle=Impact+of+Software+Optimization+on+Variable+Lifetimes+in+a+Microprocessor-Based+System&rft.au=Bergaoui%2C+S&rft.au=Leveugle%2C+R&rft.date=2011-01-01&rft.pub=IEEE&rft.isbn=9781424493579&rft.spage=56&rft.epage=61&rft_id=info:doi/10.1109%2FDELTA.2011.20&rft.externalDocID=5729540
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781424493579/lc.gif&client=summon&freeimage=true
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781424493579/mc.gif&client=summon&freeimage=true
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781424493579/sc.gif&client=summon&freeimage=true