Software reliability modeling based on test coverage

In order to incorporate the effect of test coverage, two novel software reliability growth models (SRGMs) are proposed in this paper using failure data and test coverage simultaneously. One is continuous using testing time, and the other is discrete with respect to the number of executed test cases...

Full description

Saved in:
Bibliographic Details
Published in:2011 9th International Conference on Reliability, Maintainability and Safety pp. 665 - 671
Main Authors: Shuanqi Wang, Yumei Wu, Minyan Lu, Haifeng Li
Format: Conference Proceeding
Language:English
Published: IEEE 01.06.2011
Subjects:
beta function
Equations
Fault detection
Mathematical model
mean value function
non-homogeneous poisson process
Software
Software reliability
Software reliability growth model
test coverage function
Testing
ISBN:9781612846675, 161284667X
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Abstract In order to incorporate the effect of test coverage, two novel software reliability growth models (SRGMs) are proposed in this paper using failure data and test coverage simultaneously. One is continuous using testing time, and the other is discrete with respect to the number of executed test cases instead of testing time. Since one of the most important factors of the coverage-based SRGMs is the test coverage function (TCF), we first discuss a discrete TCF based on Beta function. Then we develop mean value functions (MVF) of the two models integrating test coverage and imperfect debugging. Finally the proposed TCF and MVFs are evaluated and validated on actual software reliability data collected from real software development projects. The results demonstrate clearly that both the proposed TCF and SRGMs provide better estimation and fitting for the data sets under comparisons.
AbstractList In order to incorporate the effect of test coverage, two novel software reliability growth models (SRGMs) are proposed in this paper using failure data and test coverage simultaneously. One is continuous using testing time, and the other is discrete with respect to the number of executed test cases instead of testing time. Since one of the most important factors of the coverage-based SRGMs is the test coverage function (TCF), we first discuss a discrete TCF based on Beta function. Then we develop mean value functions (MVF) of the two models integrating test coverage and imperfect debugging. Finally the proposed TCF and MVFs are evaluated and validated on actual software reliability data collected from real software development projects. The results demonstrate clearly that both the proposed TCF and SRGMs provide better estimation and fitting for the data sets under comparisons.
Author Yumei Wu
Shuanqi Wang
Haifeng Li
Minyan Lu
Author_xml – sequence: 1
  surname: Shuanqi Wang
  fullname: Shuanqi Wang
  email: wangshuanqi@163.com
  organization: Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
– sequence: 2
  surname: Yumei Wu
  fullname: Yumei Wu
  email: wuyumei@buaa.edu.cn
  organization: Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
– sequence: 3
  surname: Minyan Lu
  fullname: Minyan Lu
  email: lmy@buaa.edu.cn
  organization: Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
– sequence: 4
  surname: Haifeng Li
  fullname: Haifeng Li
  email: lihaifeng@dse.buaa.edu.cn
  organization: Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
BookMark eNo1j81Kw0AUhUdU0Na8gG7mBRLnzmT-lhK0FiqC7b7czNwpkTSRJCh9ewPWszl8m49zFuyq6zti7B5EASD847r6eNsWUgAU2luvrLpgCzAgXWmMgUuWeev-2eoblo3jp5hjjDfK3rJy26fpBwfiA7UN1k3bTCd-7ONM3YHXOFLkfccnGice-m8a8EB37DphO1J27iXbvTzvqtd8875aV0-bvPFiymPptHagSNZOEGKCBEE7XddIQfhgg4wqJo_zQGUSUBmilR5JEkh0Wi3Zw5-2IaL919AccTjtzz_VLwvqSNo
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/ICRMS.2011.5979373
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Xplore
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Xplore
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
EISBN 1612846661
9781612846651
1612846653
9781612846668
EndPage 671
ExternalDocumentID 5979373
Genre orig-research
GroupedDBID 6IE
6IF
6IK
6IL
6IN
AAJGR
AAWTH
ADFMO
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
IEGSK
IERZE
OCL
RIE
RIL
ID FETCH-LOGICAL-i90t-d4855813e2b80eaaf1f1c585bbaec09c7c2d3df9a81636f1e4cd729ae2e12a853
IEDL.DBID RIE
ISBN 9781612846675
161284667X
IngestDate Wed Aug 27 03:25:50 EDT 2025
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i90t-d4855813e2b80eaaf1f1c585bbaec09c7c2d3df9a81636f1e4cd729ae2e12a853
PageCount 7
ParticipantIDs ieee_primary_5979373
PublicationCentury 2000
PublicationDate 2011-June
PublicationDateYYYYMMDD 2011-06-01
PublicationDate_xml – month: 06
  year: 2011
  text: 2011-June
PublicationDecade 2010
PublicationTitle 2011 9th International Conference on Reliability, Maintainability and Safety
PublicationTitleAbbrev ICRMS
PublicationYear 2011
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0000669637
Score 1.4751359
Snippet In order to incorporate the effect of test coverage, two novel software reliability growth models (SRGMs) are proposed in this paper using failure data and...
SourceID ieee
SourceType Publisher
StartPage 665
SubjectTerms beta function
Equations
Fault detection
Mathematical model
mean value function
non-homogeneous poisson process
Software
Software reliability
Software reliability growth model
test coverage function
Testing
Title Software reliability modeling based on test coverage
URI https://ieeexplore.ieee.org/document/5979373
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3PS8MwFA7b8OBJZRN_k4NH65L-SnoeDj04httht_GavMBAOqndxP_el7ZWBC9eSlpK6CPhfR-ved_H2C0IYsWYQECbI6ILpkEeEZGziQajRZ7GxtVmE2o206tVNu-xu64XBhHrw2d474f1v3y7NTtfKhsT-SU0jfqsr1Ta9Gp19RSCTtpL3oKPOAzl3DRVrcBOd598N82IbPw0eXleNAqe7ay_7FVqdJke_e-7jtnop02PzzsAOmE9LIYsXlBi_YASeYmvm0aF-5PXhjf0EveoZfm24EQxK278AU7KKCO2nD4sJ49Ba40QbDJRBdZLumgZYZhrgQBOOmmI-Oc5oBGZUSa0kXUZUPBR6iTGxhKLBgxRhkAIfcoGxbbAM8aVdNpEoIS1KtbGgbYC0DlIMhc6mZ-zoQ94_daIX6zbWC_-fnzJDpuiqy9TXLFBVe7wmh2YfbV5L2_qFfsC5--UrQ
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1NS8NAEB1qFfSk0orf7sGjsZvvzblYWmxLsT30Vja7s1CQtMRU8d87m8SI4MVL2ISwZNhl3mOy8x7AveTEijGUDm0Ony4YOalPRE6HQirB0yhQpjSbiKdTsVwmsxY8NL0wiFgePsNHOyz_5euN2tlSWY_IL6Gpvwf7YRB4vOrWaioqBJ60m6wJH7EYyrpRFNcSO819-N02w5PeqP8ymVcanvW8vwxWSnwZHP_vy06g-9Oox2YNBJ1CC7MOBHNKrR8yR5bj67rS4f5kpeUNvcQsbmm2yRiRzIIpe4STckoXFoOnRX_o1OYIzjrhhaOtqItwffRSwVFK4xpXEfVPU4mKJypWnva1SSQF70fGxUBp4tESPXQ9SRh9Bu1sk-E5sNg1Qvky5lrHgVBGCs0lGiPDxHjGTS-gYwNebSv5i1Ud6-Xfj-_gcLiYjFfj0fT5Co6qEqwtWlxDu8h3eAMH6r1Yv-W35ep9AdhHl_Q
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2011+9th+International+Conference+on+Reliability%2C+Maintainability+and+Safety&rft.atitle=Software+reliability+modeling+based+on+test+coverage&rft.au=Shuanqi+Wang&rft.au=Yumei+Wu&rft.au=Minyan+Lu&rft.au=Haifeng+Li&rft.date=2011-06-01&rft.pub=IEEE&rft.isbn=9781612846675&rft.spage=665&rft.epage=671&rft_id=info:doi/10.1109%2FICRMS.2011.5979373&rft.externalDocID=5979373
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781612846675/lc.gif&client=summon&freeimage=true
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781612846675/mc.gif&client=summon&freeimage=true
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781612846675/sc.gif&client=summon&freeimage=true