A Next Generation Test Framework for Automated Storage System Readiness Validation

A next generation test framework is presented which offers automated electrical and mechanical manipulation of storage system components. This automated manipulation of storage system components in a controlled test environment enables long- term application of maintenance and fault profiles to vali...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:2006 IEEE Autotestcon S. 300 - 305
Hauptverfasser: Hagerott, S.G., Balasubramanian, S.
Format: Tagungsbericht
Sprache:Englisch
Veröffentlicht: IEEE 01.09.2006
Schlagworte:
Automatic testing
Availability
Costs
Hardware
Large scale integration
Logic testing
Maintenance
Next generation networking
Storage automation
System testing
ISBN:1424400511, 9781424400515
ISSN:1088-7725
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Abstract A next generation test framework is presented which offers automated electrical and mechanical manipulation of storage system components. This automated manipulation of storage system components in a controlled test environment enables long- term application of maintenance and fault profiles to validate high availability of the storage system to the network. This test framework can be readily extended at low cost to other electromechanical components to validate their system readiness. The salient attributes of the framework's architecture, deployed components, and application programming interface (API) are presented. A concluding case study is provided to illustrate the successful application of this test automation framework to enterprise class RAID storage system testing.
AbstractList A next generation test framework is presented which offers automated electrical and mechanical manipulation of storage system components. This automated manipulation of storage system components in a controlled test environment enables long- term application of maintenance and fault profiles to validate high availability of the storage system to the network. This test framework can be readily extended at low cost to other electromechanical components to validate their system readiness. The salient attributes of the framework's architecture, deployed components, and application programming interface (API) are presented. A concluding case study is provided to illustrate the successful application of this test automation framework to enterprise class RAID storage system testing.
Author Balasubramanian, S.
Hagerott, S.G.
Author_xml – sequence: 1
  givenname: S.G.
  surname: Hagerott
  fullname: Hagerott, S.G.
  organization: Engenio Storage Group, LSI Logic Corp., Wichita, KS
– sequence: 2
  givenname: S.
  surname: Balasubramanian
  fullname: Balasubramanian, S.
  organization: Engenio Storage Group, LSI Logic Corp., Wichita, KS
BookMark eNo1j91KwzAARiNOcJt7Ab3JC3QmaX7ayzK2KQyFtXo70vWLVNdWkoju7f2_-jgX58A3IaN-6EHIJWdzzll-XTxUy7KaC8b0XGSpNvKEzHKTcSmkZEwJcUom_8D5iIw5y7LEGKHOySSEZ8a-XTUm24Le4SPSNXp4G9uhpxVCpCtvO7wP_oW6wdPiLQ6djWhoGQdvn0DLY4jo6Ba2aXuEQB_toW1-AhfkzNlDwOxvp6RaLavFTbK5X98uik3S5iwmopa10xZwSiqHFNxq4YSVbp_DfF2AAJNIa9tAcq2h8sZAGS5qu1daplNy9ZttAexefdtZf9xJpkWamfQT6JdU0g
ContentType Conference Proceeding
DBID 6IE
6IH
CBEJK
RIE
RIO
DOI 10.1109/AUTEST.2006.283674
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP) 1998-present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISBN 9781424400522
142440052X
EndPage 305
ExternalDocumentID 4062387
Genre orig-research
GroupedDBID 29F
6IE
6IF
6IH
6IL
6IN
AAJGR
AAWTH
ABLEC
ADZIZ
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
IEGSK
IJVOP
IPLJI
OCL
RIE
RIL
RIO
ID FETCH-LOGICAL-i90t-2b4bf6aeef545fe3e1a62f2a4fc9e7052e2e04e3bade4166e59d7e5712bac5643
IEDL.DBID RIE
ISBN 1424400511
9781424400515
ISSN 1088-7725
IngestDate Wed Aug 27 01:58:29 EDT 2025
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i90t-2b4bf6aeef545fe3e1a62f2a4fc9e7052e2e04e3bade4166e59d7e5712bac5643
PageCount 6
ParticipantIDs ieee_primary_4062387
PublicationCentury 2000
PublicationDate 2006-Sept.
PublicationDateYYYYMMDD 2006-09-01
PublicationDate_xml – month: 09
  year: 2006
  text: 2006-Sept.
PublicationDecade 2000
PublicationTitle 2006 IEEE Autotestcon
PublicationTitleAbbrev AUTEST
PublicationYear 2006
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0020065
ssj0000506935
ssj0052894
Score 1.3671932
Snippet A next generation test framework is presented which offers automated electrical and mechanical manipulation of storage system components. This automated...
SourceID ieee
SourceType Publisher
StartPage 300
SubjectTerms Automatic testing
Availability
Costs
Hardware
Large scale integration
Logic testing
Maintenance
Next generation networking
Storage automation
System testing
Title A Next Generation Test Framework for Automated Storage System Readiness Validation
URI https://ieeexplore.ieee.org/document/4062387
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV07b8IwELYAdWiXPqDqWx461sVJ_MAjqkCdECpRxYYS-yyxQEVDf3_PMQGGLt3iTNHldN_ne3xHyLP1iXSaA0Nq65konWIDLyXLhOdOG8R47uplE3oyGcznZtoiL_tZGACom8_gNTzWtXy3ttuQKusj-CDC6DZpa63irNY-n8IlVyY76OzxunwXDxJvFSJ22g8CnZTNhFdwyaQRftqdZTNaw00ffWQ0y2PJAnFYhbbAoyUsNQaNz__39Rekdxjmo9M9TF2SFqyuyNmRDmGXfAzpBIM0jRrU4VfRHNGCjpvOLYrUlg631Rr5LTg6w4s6xiEa5c5pbMTHkEk_kdXHJU09ko9H-ds72y1bYEvDK5aWovSqAPBIqTxkkBQq9WkhvDWg0YKQAheQlYUD5HAKpHEapE7SsrASac016azWK7gh1NlCSpu61CgQGS-CxpHRzgnLrcAQcUu6wTiLryinsdjZ5e7v1_fkNGY9QlvXA-lUmy08khP7Uy2_N0-1D_wCLXmp9Q
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LTwIxEG4QTdSLDzC-7cGjK6Xb7tIjMRCMuCGyMdzIbjtNuIDBxd_vdMsCBy_etntqps18X-fxDSGP2raliRkESG1tIHITBR0rZRAKy0ysEOOZKYdNxEnSmUzUqEaeNr0wAFAWn8Gz-yxz-WahVy5U1kLwQYSJ98i-FIIz3621iagwySIVbpX2WJnA8wuJ7wrha-07jlDKqsfLXcp2Jf20XsuquYapFt6S3jj1SQtE4sgVBu6MYSlRqH_yv_2fkua2nY-ONkB1RmowPyfHO0qEDfLRpQm6aepVqN1h0RTxgvar2i2K5JZ2V8UCGS4YOsanOnoi6gXPqS_FR6dJP5HX-zFNTZL2e-nLIFiPWwhmihUBz0VuowzAIqmyEEI7i7jlmbBaQYwWBA5MQJhnBpDFRSCViUHGbZ5nWiKxuSD1-WIOl4QanUmpueEqAhGyzKkcqdgYoZnGg5NXpOGMM_3yghrTtV2u__79QA4H6ftwOnxN3m7IkY-BuCKvW1Ivliu4Iwf6p5h9L-_L-_ALOqqtPA
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2006+IEEE+Autotestcon&rft.atitle=A+Next+Generation+Test+Framework+for+Automated+Storage+System+Readiness+Validation&rft.au=Hagerott%2C+S.G.&rft.au=Balasubramanian%2C+S.&rft.date=2006-09-01&rft.pub=IEEE&rft.isbn=9781424400515&rft.issn=1088-7725&rft.spage=300&rft.epage=305&rft_id=info:doi/10.1109%2FAUTEST.2006.283674&rft.externalDocID=4062387
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1088-7725&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1088-7725&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1088-7725&client=summon