Possible Approaches to Organizing Self-Test of a Self-Routing Analog-To-Digital Converter Based on a Neural Network

The article provides a review of the literature on the development of a self-routing analog-to-digital converter (ADC) based on a neural network (SRADC NN). The advantages and disadvantages of SRADC NN are described. Approaches to the implementation of self-testing algorithms of the device are propo...

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Bibliographic Details
Published in:IEEE NW Russia Young Researchers in Electrical and Electronic Engineering Conference pp. 391 - 394
Main Authors: Naborshchikov, Anton A., Yuzhakov, Alexander A., Posyagin, Anton I.
Format: Conference Proceeding
Language:English
Published: IEEE 25.01.2022
Subjects:
Aging
analog-to-digital converter
Artificial neural networks
Built-in self-test
Capacitance
Costs
fault tolerance
Hardware
majorization
neural network
Resistors
self-test system
ISSN:2376-6565
Online Access:Get full text
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Summary:The article provides a review of the literature on the development of a self-routing analog-to-digital converter (ADC) based on a neural network (SRADC NN). The advantages and disadvantages of SRADC NN are described. Approaches to the implementation of self-testing algorithms of the device are proposed, as well as the purpose and objectives for further research are formulated.
ISSN:2376-6565
DOI:10.1109/ElConRus54750.2022.9755768