Possible Approaches to Organizing Self-Test of a Self-Routing Analog-To-Digital Converter Based on a Neural Network

The article provides a review of the literature on the development of a self-routing analog-to-digital converter (ADC) based on a neural network (SRADC NN). The advantages and disadvantages of SRADC NN are described. Approaches to the implementation of self-testing algorithms of the device are propo...

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Vydáno v:IEEE NW Russia Young Researchers in Electrical and Electronic Engineering Conference s. 391 - 394
Hlavní autoři: Naborshchikov, Anton A., Yuzhakov, Alexander A., Posyagin, Anton I.
Médium: Konferenční příspěvek
Jazyk:angličtina
Vydáno: IEEE 25.01.2022
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ISSN:2376-6565
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Abstract The article provides a review of the literature on the development of a self-routing analog-to-digital converter (ADC) based on a neural network (SRADC NN). The advantages and disadvantages of SRADC NN are described. Approaches to the implementation of self-testing algorithms of the device are proposed, as well as the purpose and objectives for further research are formulated.
AbstractList The article provides a review of the literature on the development of a self-routing analog-to-digital converter (ADC) based on a neural network (SRADC NN). The advantages and disadvantages of SRADC NN are described. Approaches to the implementation of self-testing algorithms of the device are proposed, as well as the purpose and objectives for further research are formulated.
Author Naborshchikov, Anton A.
Yuzhakov, Alexander A.
Posyagin, Anton I.
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  givenname: Alexander A.
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  givenname: Anton I.
  surname: Posyagin
  fullname: Posyagin, Anton I.
  email: posyagin.anton@gmail.com
  organization: Perm National Research Polytechnic University (PNRPU),Automation and Telemechanics Department,Perm,Russia
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Snippet The article provides a review of the literature on the development of a self-routing analog-to-digital converter (ADC) based on a neural network (SRADC NN)....
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SubjectTerms Aging
analog-to-digital converter
Artificial neural networks
Built-in self-test
Capacitance
Costs
fault tolerance
Hardware
majorization
neural network
Resistors
self-test system
Title Possible Approaches to Organizing Self-Test of a Self-Routing Analog-To-Digital Converter Based on a Neural Network
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