Fukuda, K., Nishizawa, M., Tada, T., Bolotov, L., Suzuki, K., Sato, S., . . . Kanayama, T. (2014, September). Simulation of light-illuminated STM measurements. International Conference on Simulation of Semiconductor Processes and Devices, 129-132. https://doi.org/10.1109/SISPAD.2014.6931580
Chicago-Zitierstil (17. Ausg.)Fukuda, Koichi, Masayasu Nishizawa, Tetsuya Tada, Leonid Bolotov, Kaina Suzuki, Shigeo Sato, Hiroshi Arimoto, und Toshihiko Kanayama. "Simulation of Light-illuminated STM Measurements." International Conference on Simulation of Semiconductor Processes and Devices Sep. 2014: 129-132. https://doi.org/10.1109/SISPAD.2014.6931580.
MLA-Zitierstil (9. Ausg.)Fukuda, Koichi, et al. "Simulation of Light-illuminated STM Measurements." International Conference on Simulation of Semiconductor Processes and Devices, Sep. 2014, pp. 129-132, https://doi.org/10.1109/SISPAD.2014.6931580.