Proceedings : 1994 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, June 21-23, 1994, Seattle, Washington

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Bibliographic Details
Main Authors: IEEE Computer Society Conference on Computer Vision and Pattern Recognition, IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis
Format: Book
Language:English
Published: Los Alamitos ; Tokyo IEEE Computer Society Press 1994
Subjects:
Computer vision > Congresses
Pattern recognition systems > Congresses
ISBN:9780818658273, 9780818658259, 0818658274, 0818658258, 0818658266, 9780818658266
Online Access:Get full text
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Description
Bibliography:"IEEE catalog number 94CH3405-8"--T.p. verso
"IEEE Computer Society Press order number 5825-02"--T.p. verso
Includes bibliographies and index
ISBN:9780818658273
9780818658259
0818658274
0818658258
0818658266
9780818658266