Joint Estimation of IQ Parameters and Channel Response for OFDM Systems

In this paper, we develop a new algorithm to jointly estimate the channel impulse response and inphase-quadrature (IQ) imbalances for OFDM systems. The estimation algorithm is based on the expectation maximization(EM) algorithm, exploiting information from the pilot symbols and detected data symbols...

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Veröffentlicht in:2010 IEEE 72nd Vehicular Technology Conference - Fall S. 1 - 5
Hauptverfasser: Marey, M, Samir, M, Dobre, O, El-Shenawy, H, El-Henawy, A
Format: Tagungsbericht
Sprache:Englisch
Veröffentlicht: IEEE 01.09.2010
Schlagworte:
Bit error rate
Detectors
Maximum likelihood estimation
OFDM
Receivers
Transmitters
ISBN:1424435730, 9781424435739
ISSN:1090-3038
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Abstract In this paper, we develop a new algorithm to jointly estimate the channel impulse response and inphase-quadrature (IQ) imbalances for OFDM systems. The estimation algorithm is based on the expectation maximization(EM) algorithm, exploiting information from the pilot symbols and detected data symbols in a systematic fashion. To reduce the complexity of the estimation algorithm, a suboptimal scheme is also introduced. The results indicate that the proposed algorithms achieve a significant improvement in the bit error rate (BER) performance when compared with conventional data-aided algorithms.
AbstractList In this paper, we develop a new algorithm to jointly estimate the channel impulse response and inphase-quadrature (IQ) imbalances for OFDM systems. The estimation algorithm is based on the expectation maximization(EM) algorithm, exploiting information from the pilot symbols and detected data symbols in a systematic fashion. To reduce the complexity of the estimation algorithm, a suboptimal scheme is also introduced. The results indicate that the proposed algorithms achieve a significant improvement in the bit error rate (BER) performance when compared with conventional data-aided algorithms.
Author Marey, M
Dobre, O
Samir, M
El-Shenawy, H
El-Henawy, A
Author_xml – sequence: 1
  givenname: M
  surname: Marey
  fullname: Marey, M
  email: mfmmarey@mun.ca
  organization: Fac. of Eng. & Appl. Sci., Memorial Univ. of Newfoundland, St. John's, NL, Canada
– sequence: 2
  givenname: M
  surname: Samir
  fullname: Samir, M
  organization: Fac. of Eng., El-Shorouk Acad., Cairo, Egypt
– sequence: 3
  givenname: O
  surname: Dobre
  fullname: Dobre, O
  email: odobre@mun.ca
  organization: Fac. of Eng. & Appl. Sci., Memorial Univ. of Newfoundland, St. John's, NL, Canada
– sequence: 4
  givenname: H
  surname: El-Shenawy
  fullname: El-Shenawy, H
  organization: Fac. of Eng., El-Shorouk Acad., Cairo, Egypt
– sequence: 5
  givenname: A
  surname: El-Henawy
  fullname: El-Henawy, A
  organization: Fac. of Eng., Ain Shams Univ., Cairo, Egypt
BookMark eNpFkM1uwjAQhF2VSiW0T8DFLxC6tjeJfazSQKmo6A_tFTmwVlMRG8W58PZEKlJPoxnpG40mYSMfPDE2FTATAszDd7WpyvlMwhBkmUFh5BVLBEpElRVorv-NghEbDwykCpS-ZUmMvwAgRC7HbPESGt_zKvZNa_smeB4cX77zN9vZlnrqIrd-z8sf6z0d-AfFY_CRuAsdX8-fXvnnKfbUxjt24-wh0v1FJ-xrXm3K53S1XizLx1XaSAl9ugNTOELKnNZ6RxbRFeSy2lGtFYAW4GplDJDOc7NHhUBKOFFLFLlCI9WETf96GyLaHrthdXfaXh5QZ81GTlg
ContentType Conference Proceeding
DBID 6IE
6IH
CBEJK
RIE
RIO
DOI 10.1109/VETECF.2010.5594192
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP) 1998-present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISBN 1424435749
9781424435746
EndPage 5
ExternalDocumentID 5594192
Genre orig-research
GroupedDBID -~X
29I
6IE
6IH
AFFNX
AI.
ALMA_UNASSIGNED_HOLDINGS
CBEJK
RIE
RIO
RNS
VH1
ID FETCH-LOGICAL-i220t-c097fe4e5f888cea44f7ef5bfeb8300810fb3990e8669d4340e31f1b241634923
IEDL.DBID RIE
ISBN 1424435730
9781424435739
ISICitedReferencesCount 0
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000287525200276&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN 1090-3038
IngestDate Wed Aug 27 02:23:01 EDT 2025
IsDoiOpenAccess false
IsOpenAccess true
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i220t-c097fe4e5f888cea44f7ef5bfeb8300810fb3990e8669d4340e31f1b241634923
OpenAccessLink https://doi.org/10.1109/vetecf.2010.5594192
PageCount 5
ParticipantIDs ieee_primary_5594192
PublicationCentury 2000
PublicationDate 2010-Sept.
PublicationDateYYYYMMDD 2010-09-01
PublicationDate_xml – month: 09
  year: 2010
  text: 2010-Sept.
PublicationDecade 2010
PublicationTitle 2010 IEEE 72nd Vehicular Technology Conference - Fall
PublicationTitleAbbrev VETECF
PublicationYear 2010
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0001162
ssj0000451999
Score 1.7574896
Snippet In this paper, we develop a new algorithm to jointly estimate the channel impulse response and inphase-quadrature (IQ) imbalances for OFDM systems. The...
SourceID ieee
SourceType Publisher
StartPage 1
SubjectTerms Bit error rate
Detectors
Maximum likelihood estimation
OFDM
Receivers
Transmitters
Title Joint Estimation of IQ Parameters and Channel Response for OFDM Systems
URI https://ieeexplore.ieee.org/document/5594192
WOSCitedRecordID wos000287525200276&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3JTsMwEB21FQe4sLSIXT5wJNRJ3CznkrBIlIIK6q2K7bFUqUpQSfl-7NgtIHHhlkSOEnmcmRfPvDcAl4oZ1xhp5MYl8xhy5umoKD2e-CYrJwOfs6bZRDwaJdNpOm7B1YYLg4hN8Rlem8Mmly8rsTJbZX2Nfk3Ssg3tOI4tV2uzn9LopBho7byw70c205lqP0PDZE3qCgd6Ta-1ntx56uSI9OD-WzbJhrmt-XLP-9V4pYk7-e7_3ngPet8EPjLehKZ9aGF5ADs_tAe7cPtQzcuaZPoTt-xFUily_0zGhSnXMpqbpCglMeyDEhfkxdbSItEglzzlN4_EaZ334DXPJsM7z3VV8OZBQGtP0DRWyHCg9M-vwIIxFaMacIU8CQ1CoIpr1EIxiaJUalNSDH3l88BANyPndgidsirxCEhEVcKl0HcyZFER6vUQartjKgohJKPH0DVTMnu3whkzNxsnf18-hW2bmjcFXGfQqZcrPIct8VnPP5YXjbW_AEazokc
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1NT4NAEJ3UaqJe_Ggbv92DR7ELLBTOFWy1rdVU01vD7s4mTQyYSv397gKtmnjxBmQJZGeZeezMewNwpZhxjb5GblwyiyFnlo6K0uKBbbJy0rE5K5pNdEajYDoNxzW4XnNhELEoPsMbc1jk8mUmlmarrK3Rr0labsCmx5hjl2yt9Y5KoZRiwHXlh23bL3OdofY01A1WtC7X06t6pfZUnYeVIJEe3H6NJlE3Lqu-qif-ar1SRJ5473_vvA_NbwofGa-D0wHUMD2E3R_qgw24u8_maU4i_ZGX_EWSKdJ_IuPEFGwZ1U2SpJIY_kGKb-S5rKZFomEueYxvh6RSO2_CSxxNuj2r6qtgzR2H5pagYUchQ0_p31-BCWOqg8rjCnngGoxAFde4hWLg-6HUxqTo2srmjgFvRtCtBfU0S_EIiE9VwKXQdzJkfuLqFeFqy2MoEiEko8fQMFMyey-lM2bVbJz8ffkStnuT4WA26I8eTmGnTNSbcq4zqOeLJZ7DlvjM5x-Li8LyX-8dpY4
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2010+IEEE+72nd+Vehicular+Technology+Conference+-+Fall&rft.atitle=Joint+Estimation+of+IQ+Parameters+and+Channel+Response+for+OFDM+Systems&rft.au=Marey%2C+M&rft.au=Samir%2C+M&rft.au=Dobre%2C+O&rft.au=El-Shenawy%2C+H&rft.date=2010-09-01&rft.pub=IEEE&rft.isbn=9781424435739&rft.issn=1090-3038&rft.spage=1&rft.epage=5&rft_id=info:doi/10.1109%2FVETECF.2010.5594192&rft.externalDocID=5594192
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1090-3038&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1090-3038&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1090-3038&client=summon