Variability Aware FET Model With Physics Knowledge Based Machine Learning

We present variability-aware, computationally efficient, models for Fin Field Effect Transistors (FinFETs) using various machine learning (ML) architectures. This paper provides a detailed comparison of the various architectures. Our physics knowledge-based artificial neural networks (ANNs) demonstr...

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Bibliographic Details

Published in:	2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) pp. 1 - 3
Main Authors:	Sheelvardhan, Kumar, Guglani, Surila, Ehteshamuddin, M., Roy, Sourajeet, Dasgupta, Avirup
Format:	Conference Proceeding
Language:	English
Published:	IEEE 07.03.2023
Subjects:	Artificial neural networks Computational modeling Computer architecture Field effect transistors Knowledge based systems Machine learning Training
Online Access:	Get full text
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