Smart Sampling for Efficient System Level Test: A Robust Machine Learning Approach

System level tests (SLTs) are important and expensive procedures to ensure high quality of IC products. In the volume production stage with stable yield, efforts such as random sampling have been made to improve testing efficiency. However random sampling doesn't fully utilize information gathe...

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Vydané v:	Proceedings - International Test Conference s. 53 - 62
Hlavní autori:	Liu, Chenwei, Ou, Jie
Médium:	Konferenčný príspevok..
Jazyk:	English
Vydavateľské údaje:	IEEE 01.10.2021
Predmet:	AutoEncoder Costs DPPM Machine learning Product design Production Robustness Semiconductor device modeling SLT Smart Sampling Support vector machines SVM
ISSN:	2378-2250
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