Special Session: Fault Criticality Assessment in AI Accelerators

The ubiquitous application of deep neural networks (DNN) has led to a rise in demand for AI accelerators. DNN-specific functional criticality analysis identifies faults that cause measurable and significant deviations from acceptable requirements such as the inferencing accuracy. This paper examines...

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Vydané v:	Proceedings - IEEE VLSI Test Symposium s. 1 - 4
Hlavní autori:	Chaudhuri, Arjun, Talukdar, Jonti, Chakrabarty, Krishnendu
Médium:	Konferenčný príspevok..
Jazyk:	English
Vydavateľské údaje:	IEEE 25.04.2022
Predmet:	AI accelerators Deep learning Fault diagnosis Neural networks Supervised learning Training Very large scale integration
ISSN:	2375-1053
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