APA (7th ed.) Citation

Chaudhuri, A., Talukdar, J., & Chakrabarty, K. (2022, April 25). Special Session: Fault Criticality Assessment in AI Accelerators. Proceedings - IEEE VLSI Test Symposium, 1-4. https://doi.org/10.1109/VTS52500.2021.9794215

Chicago Style (17th ed.) Citation

Chaudhuri, Arjun, Jonti Talukdar, and Krishnendu Chakrabarty. "Special Session: Fault Criticality Assessment in AI Accelerators." Proceedings - IEEE VLSI Test Symposium 25 Apr. 2022: 1-4. https://doi.org/10.1109/VTS52500.2021.9794215.

MLA (9th ed.) Citation

Chaudhuri, Arjun, et al. "Special Session: Fault Criticality Assessment in AI Accelerators." Proceedings - IEEE VLSI Test Symposium, 25 Apr. 2022, pp. 1-4, https://doi.org/10.1109/VTS52500.2021.9794215.