Event Probability Mask (EPM) and Event Denoising Convolutional Neural Network (EDnCNN) for Neuromorphic Cameras

This paper presents a novel method for labeling real-world neuromorphic camera sensor data by calculating the likelihood of generating an event at each pixel within a short time window, which we refer to as "event probability mask" or EPM. Its applications include (i) objective benchmarkin...

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Bibliographic Details

Published in:	Proceedings (IEEE Computer Society Conference on Computer Vision and Pattern Recognition. Online) pp. 1698 - 1707
Main Authors:	Baldwin, R. Wes, Almatrafi, Mohammed, Asari, Vijayan, Hirakawa, Keigo
Format:	Conference Proceeding
Language:	English
Published:	IEEE 01.06.2020
Subjects:	Benchmark testing Cameras Hardware Neuromorphics Noise measurement Noise reduction Voltage control
ISSN:	1063-6919
Online Access:	Get full text
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