APA (7th ed.) Citation

Somasundaram, N., Mehdipour, F., Lee, J., Ramadass, N., & Rao, Y. V. R. (2013, August). Totally self-checking (TSC) VLSI circuits using Scalable Error Detection Coding (SEDC) technique. 2013 5th Asia Symposium on Quality Electronic Design (ASQED), 72-79. https://doi.org/10.1109/ASQED.2013.6643567

Chicago Style (17th ed.) Citation

Somasundaram, Natarajan, Farhad Mehdipour, Jeong-A Lee, N. Ramadass, and Y. V. Ramana Rao. "Totally Self-checking (TSC) VLSI Circuits Using Scalable Error Detection Coding (SEDC) Technique." 2013 5th Asia Symposium on Quality Electronic Design (ASQED) Aug. 2013: 72-79. https://doi.org/10.1109/ASQED.2013.6643567.

MLA (9th ed.) Citation

Somasundaram, Natarajan, et al. "Totally Self-checking (TSC) VLSI Circuits Using Scalable Error Detection Coding (SEDC) Technique." 2013 5th Asia Symposium on Quality Electronic Design (ASQED), Aug. 2013, pp. 72-79, https://doi.org/10.1109/ASQED.2013.6643567.