APA (7th ed.) Citation

Ji, S., Lee, S., Lee, C., Han, Y., & Im, H. (2025, March 31). Impact of Large Language Models of Code on Fault Localization. 2025 IEEE Conference on Software Testing, Verification and Validation (ICST), 302-313. https://doi.org/10.1109/ICST62969.2025.10989036

Chicago Style (17th ed.) Citation

Ji, Suhwan, Sanghwa Lee, Changsup Lee, Yo-Sub Han, and Hyeonseung Im. "Impact of Large Language Models of Code on Fault Localization." 2025 IEEE Conference on Software Testing, Verification and Validation (ICST) 31 Mar. 2025: 302-313. https://doi.org/10.1109/ICST62969.2025.10989036.

MLA (9th ed.) Citation

Ji, Suhwan, et al. "Impact of Large Language Models of Code on Fault Localization." 2025 IEEE Conference on Software Testing, Verification and Validation (ICST), 31 Mar. 2025, pp. 302-313, https://doi.org/10.1109/ICST62969.2025.10989036.