Ji, S., Lee, S., Lee, C., Han, Y., & Im, H. (2025, March 31). Impact of Large Language Models of Code on Fault Localization. 2025 IEEE Conference on Software Testing, Verification and Validation (ICST), 302-313. https://doi.org/10.1109/ICST62969.2025.10989036
Chicago-Zitierstil (17. Ausg.)Ji, Suhwan, Sanghwa Lee, Changsup Lee, Yo-Sub Han, und Hyeonseung Im. "Impact of Large Language Models of Code on Fault Localization." 2025 IEEE Conference on Software Testing, Verification and Validation (ICST) 31 Mar. 2025: 302-313. https://doi.org/10.1109/ICST62969.2025.10989036.
MLA-Zitierstil (9. Ausg.)Ji, Suhwan, et al. "Impact of Large Language Models of Code on Fault Localization." 2025 IEEE Conference on Software Testing, Verification and Validation (ICST), 31 Mar. 2025, pp. 302-313, https://doi.org/10.1109/ICST62969.2025.10989036.