Citáce podľa APA (7th ed.)

Ji, S., Lee, S., Lee, C., Han, Y., & Im, H. (2025, March 31). Impact of Large Language Models of Code on Fault Localization. 2025 IEEE Conference on Software Testing, Verification and Validation (ICST), 302-313. https://doi.org/10.1109/ICST62969.2025.10989036

Citácia podle Chicago (17th ed.)

Ji, Suhwan, Sanghwa Lee, Changsup Lee, Yo-Sub Han, a Hyeonseung Im. "Impact of Large Language Models of Code on Fault Localization." 2025 IEEE Conference on Software Testing, Verification and Validation (ICST) 31 Mar. 2025: 302-313. https://doi.org/10.1109/ICST62969.2025.10989036.

Citácia podľa MLA (8th ed.)

Ji, Suhwan, et al. "Impact of Large Language Models of Code on Fault Localization." 2025 IEEE Conference on Software Testing, Verification and Validation (ICST), 31 Mar. 2025, pp. 302-313, https://doi.org/10.1109/ICST62969.2025.10989036.

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