Fast spatially variant deconvolution for optical microscopy via iterative shrinkage thresholding

Deconvolution offers an effective way to improve the resolution of optical microscopy data. While fast algorithms are available when the point spread function (PSF) is shift-invariant (SI), they are not directly applicable in thick samples, where the problem is shift-variant (SV). Here, we propose a...

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Bibliographic Details

Published in:	Proceedings of the ... IEEE International Conference on Acoustics, Speech and Signal Processing (1998) pp. 2838 - 2842
Main Authors:	Chacko, Nikhil, Liebling, Michael
Format:	Conference Proceeding
Language:	English
Published:	IEEE 01.05.2014
Subjects:	Deconvolution fast iterative shrinkage/thresholding algorithms (FISTA) Integrated optics Microscopy Optical imaging Optical microscopy Optical signal processing sparsity spatially-variant de-convolution Three-dimensional displays wavelets
ISSN:	1520-6149
Online Access:	Get full text
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