Kostinger, M., Hirzer, M., Wohlhart, P., Roth, P. M., & Bischof, H. (2012, June). Large scale metric learning from equivalence constraints. 2012 IEEE Conference on Computer Vision and Pattern Recognition, 2288-2295. https://doi.org/10.1109/CVPR.2012.6247939
Citácia podle Chicago (17th ed.)Kostinger, M., M. Hirzer, P. Wohlhart, P. M. Roth, a H. Bischof. "Large Scale Metric Learning from Equivalence Constraints." 2012 IEEE Conference on Computer Vision and Pattern Recognition Jun. 2012: 2288-2295. https://doi.org/10.1109/CVPR.2012.6247939.
Citácia podľa MLA (8th ed.)Kostinger, M., et al. "Large Scale Metric Learning from Equivalence Constraints." 2012 IEEE Conference on Computer Vision and Pattern Recognition, Jun. 2012, pp. 2288-2295, https://doi.org/10.1109/CVPR.2012.6247939.