APA (7th ed.) Citation

Kostinger, M., Hirzer, M., Wohlhart, P., Roth, P. M., & Bischof, H. (2012, June). Large scale metric learning from equivalence constraints. 2012 IEEE Conference on Computer Vision and Pattern Recognition, 2288-2295. https://doi.org/10.1109/CVPR.2012.6247939

Chicago Style (17th ed.) Citation

Kostinger, M., M. Hirzer, P. Wohlhart, P. M. Roth, and H. Bischof. "Large Scale Metric Learning from Equivalence Constraints." 2012 IEEE Conference on Computer Vision and Pattern Recognition Jun. 2012: 2288-2295. https://doi.org/10.1109/CVPR.2012.6247939.

MLA (9th ed.) Citation

Kostinger, M., et al. "Large Scale Metric Learning from Equivalence Constraints." 2012 IEEE Conference on Computer Vision and Pattern Recognition, Jun. 2012, pp. 2288-2295, https://doi.org/10.1109/CVPR.2012.6247939.