Kostinger, M., Hirzer, M., Wohlhart, P., Roth, P. M., & Bischof, H. (2012, June). Large scale metric learning from equivalence constraints. 2012 IEEE Conference on Computer Vision and Pattern Recognition, 2288-2295. https://doi.org/10.1109/CVPR.2012.6247939
Chicago-Zitierstil (17. Ausg.)Kostinger, M., M. Hirzer, P. Wohlhart, P. M. Roth, und H. Bischof. "Large Scale Metric Learning from Equivalence Constraints." 2012 IEEE Conference on Computer Vision and Pattern Recognition Jun. 2012: 2288-2295. https://doi.org/10.1109/CVPR.2012.6247939.
MLA-Zitierstil (9. Ausg.)Kostinger, M., et al. "Large Scale Metric Learning from Equivalence Constraints." 2012 IEEE Conference on Computer Vision and Pattern Recognition, Jun. 2012, pp. 2288-2295, https://doi.org/10.1109/CVPR.2012.6247939.