Zhang, L., Bai, M., Liao, R., Urtasun, R., Marcos, D., Tuia, D., & Kellenberger, B. (2018, June). Learning Deep Structured Active Contours End-to-End. 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, 8877-8885. https://doi.org/10.1109/CVPR.2018.00925
Citace podle Chicago (17th ed.)Zhang, Lisa, Min Bai, Renjie Liao, Raquel Urtasun, Diego Marcos, Devis Tuia, a Benjamin Kellenberger. "Learning Deep Structured Active Contours End-to-End." 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition Jun. 2018: 8877-8885. https://doi.org/10.1109/CVPR.2018.00925.
Citace podle MLA (9th ed.)Zhang, Lisa, et al. "Learning Deep Structured Active Contours End-to-End." 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, Jun. 2018, pp. 8877-8885, https://doi.org/10.1109/CVPR.2018.00925.