Process and temperature performance of a CMOS beta-multiplier voltage reference
The beta multiplier voltage reference (BMVR) is discussed as a direct replacement for the bandgap voltage reference in a CMOS process especially when substrate current is a concern. Performance of the BMVR with regard to temperature and process variations is covered. Experimental results from a 2-mi...
Saved in:
| Published in: | Circuits and Systems; Proceedings: Midwest Symposium on Circuits and Systems pp. 33 - 36 |
|---|---|
| Main Authors: | , |
| Format: | Conference Proceeding |
| Language: | English |
| Published: |
IEEE
1998
|
| Subjects: | |
| ISBN: | 9780818689147, 0818689145 |
| Online Access: | Get full text |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Abstract | The beta multiplier voltage reference (BMVR) is discussed as a direct replacement for the bandgap voltage reference in a CMOS process especially when substrate current is a concern. Performance of the BMVR with regard to temperature and process variations is covered. Experimental results from a 2-micron MOSIS test chip indicate that the BMVR can be tuned to within 10 mV of a desired value while maintaining a temperature coefficient below 1000 ppm/C and a supply sensitivity under 50 mV/V. |
|---|---|
| AbstractList | The beta multiplier voltage reference (BMVR) is discussed as a direct replacement for the bandgap voltage reference in a CMOS process especially when substrate current is a concern. Performance of the BMVR with regard to temperature and process variations is covered. Experimental results from a 2-micron MOSIS test chip indicate that the BMVR can be tuned to within 10 mV of a desired value while maintaining a temperature coefficient below 1000 ppm/C and a supply sensitivity under 50 mV/V. |
| Author | Song Liu Baker, R.J. |
| Author_xml | – sequence: 1 surname: Song Liu fullname: Song Liu organization: Microelectron. Res. Center, Univ. of Idaho, Boise, ID, USA – sequence: 2 givenname: R.J. surname: Baker fullname: Baker, R.J. |
| BookMark | eNotj81KxDAUhQMqqGNfYFZ5gdabaTJJlkPxD2aoUMXlEG9upNI_0ozg21sYz-Z8i8MH55ZdDuNAjK0FFEKAvT98NNWuKYS1ptDKyo29YJnVBowwW2OF1Ncsm-dvWCLVBqC8YfVrHJHmmbvB80T9RNGlUyS-QBhj7wYkPgbueHWoG_5JyeX9qUvt1LUU-c_YJfdFPFKgSMv2jl0F182U_feKvT8-vFXP-b5-eql2-7wVWqbcBjIKFAEqD2AwoEQpAwKCUp6CQGm8V1ISBqFQatTeBrtVTpQAJMoVW5-9LREdp9j2Lv4ez6_LPwzrUH0 |
| ContentType | Conference Proceeding |
| DBID | 6IE 6IH CBEJK RIE RIO |
| DOI | 10.1109/MWSCAS.1998.759429 |
| DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Proceedings Order Plan (POP) 1998-present by volume IEEE Xplore All Conference Proceedings IEEE/IET Electronic Library IEEE Proceedings Order Plans (POP) 1998-present |
| DatabaseTitleList | |
| Database_xml | – sequence: 1 dbid: RIE name: IEEE/IET Electronic Library url: https://ieeexplore.ieee.org/ sourceTypes: Publisher |
| DeliveryMethod | fulltext_linktorsrc |
| EndPage | 36 |
| ExternalDocumentID | 759429 |
| GroupedDBID | 6IE 6IH 6IK 6IL AAJGR AAWTH ACGHX ALMA_UNASSIGNED_HOLDINGS BEFXN BFFAM BGNUA BKEBE BPEOZ CBEJK OCL RIB RIC RIE RIL RIO |
| ID | FETCH-LOGICAL-i174t-9fe8505e0c5d008cfc4c44fc0c055def1c48dd544ecf15c47c7d9f965a1300e13 |
| IEDL.DBID | RIE |
| ISBN | 9780818689147 0818689145 |
| ISICitedReferencesCount | 9 |
| ISICitedReferencesURI | http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000079563200008&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| IngestDate | Tue Aug 26 17:57:28 EDT 2025 |
| IsPeerReviewed | false |
| IsScholarly | true |
| Language | English |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-i174t-9fe8505e0c5d008cfc4c44fc0c055def1c48dd544ecf15c47c7d9f965a1300e13 |
| PageCount | 4 |
| ParticipantIDs | ieee_primary_759429 |
| PublicationCentury | 1900 |
| PublicationDate | 19980000 |
| PublicationDateYYYYMMDD | 1998-01-01 |
| PublicationDate_xml | – year: 1998 text: 19980000 |
| PublicationDecade | 1990 |
| PublicationTitle | Circuits and Systems; Proceedings: Midwest Symposium on Circuits and Systems |
| PublicationTitleAbbrev | MWSCAS |
| PublicationYear | 1998 |
| Publisher | IEEE |
| Publisher_xml | – name: IEEE |
| SSID | ssj0000452003 |
| Score | 1.5551461 |
| Snippet | The beta multiplier voltage reference (BMVR) is discussed as a direct replacement for the bandgap voltage reference in a CMOS process especially when substrate... |
| SourceID | ieee |
| SourceType | Publisher |
| StartPage | 33 |
| SubjectTerms | Circuits CMOS process Equations Immune system MOSFETs Photonic band gap Resistors Temperature sensors Threshold voltage Transconductance |
| Title | Process and temperature performance of a CMOS beta-multiplier voltage reference |
| URI | https://ieeexplore.ieee.org/document/759429 |
| WOSCitedRecordID | wos000079563200008&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV07b8MgEEZN1KFTX6n6FkNXErsGY8YqatSheUhp1WwRPg4pixOlTn9_DttJVKlLN2BACNB9x3Hfd4w9BYwnGNNCpioXMnGJsOQ1Cys9PgMhHEJFFH7Xo1E2m5lJo7NdcWEQsUo-w25oVn_5bgmbECrraWXIfLZYS-u0pmrtwylBGZwuaKXwGBTgTSxVo6-z6-sdZyYyveHXtP8yDVS9rFvP-qu6SgUug9N_LeuMdQ4kPT7Zw885O8Liko2bxH9uC8eD7FSjmcxXB4IAX3pueX84nvIcSyuanELCR062qiQDw_fFRzrsc_D60X8TTc0EsaC3RSmMx4ycGoxAOYJ38CBBSg8RREo59DHIzDklJYKPFUgN2hlvUmXDvxbGyRVrF8sCrxnXNtdIpwcZJtLLPE917MihSZB8vDyzN-wi7MV8VctizOttuP1z9I6d1GS-ELu4Z-1yvcEHdgw_5eJ7_Vgd5RZ7aJy3 |
| linkProvider | IEEE |
| linkToHtml | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LT8MwDI5gIMGJ1xBvcuCaraXJ0h7RxDTEXtKG2G1KHUfapZtGx-_HabtNSFy4pTlUlRP5c21_nxl78hhPMKaFbKlUyMhGwlDULIx0-AyEcAgFUbinB4N4Ok1Glc52wYVBxKL5DBt-WdTy7QLWPlXW1Coh97nPDvzgrIqstU2oeG1wuqKFxqPXgE9CqSqFnc2z3rBmgqTZ_xy3X8aerBc3yvf-mq9SwEvn5F8fdsrqO5oeH20B6IztYXbBhlXrPzeZ5V54qlJN5ssdRYAvHDe83R-OeYq5EVVXISEkJ2-Vk4vh2_EjdfbReZ20u6KamiDm9HeRi8RhTGENBqAsATw4kCClgwACpSy6EGRsLVkQwYUKpAZtE5e0lPGVLQyjS1bLFhleMa5NqpHOD2KMpJNp2tKhpZAmQory0thcs3Nvi9myFMaYlWa4-XP3kR11J_3erPc2eL9lxyW1z2cy7lgtX63xnh3Cdz7_Wj0Ux_oD10ygAA |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=Circuits+and+Systems%3B+Proceedings%3A+Midwest+Symposium+on+Circuits+and+Systems&rft.atitle=Process+and+temperature+performance+of+a+CMOS+beta-multiplier+voltage+reference&rft.au=Song+Liu&rft.au=Baker%2C+R.J.&rft.date=1998-01-01&rft.pub=IEEE&rft.isbn=9780818689147&rft.spage=33&rft.epage=36&rft_id=info:doi/10.1109%2FMWSCAS.1998.759429&rft.externalDocID=759429 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780818689147/lc.gif&client=summon&freeimage=true |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780818689147/mc.gif&client=summon&freeimage=true |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780818689147/sc.gif&client=summon&freeimage=true |

