Process and temperature performance of a CMOS beta-multiplier voltage reference
The beta multiplier voltage reference (BMVR) is discussed as a direct replacement for the bandgap voltage reference in a CMOS process especially when substrate current is a concern. Performance of the BMVR with regard to temperature and process variations is covered. Experimental results from a 2-mi...
Uloženo v:
| Vydáno v: | Circuits and Systems; Proceedings: Midwest Symposium on Circuits and Systems s. 33 - 36 |
|---|---|
| Hlavní autoři: | , |
| Médium: | Konferenční příspěvek |
| Jazyk: | angličtina |
| Vydáno: |
IEEE
1998
|
| Témata: | |
| ISBN: | 9780818689147, 0818689145 |
| On-line přístup: | Získat plný text |
| Tagy: |
Přidat tag
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
|
| Abstract | The beta multiplier voltage reference (BMVR) is discussed as a direct replacement for the bandgap voltage reference in a CMOS process especially when substrate current is a concern. Performance of the BMVR with regard to temperature and process variations is covered. Experimental results from a 2-micron MOSIS test chip indicate that the BMVR can be tuned to within 10 mV of a desired value while maintaining a temperature coefficient below 1000 ppm/C and a supply sensitivity under 50 mV/V. |
|---|---|
| AbstractList | The beta multiplier voltage reference (BMVR) is discussed as a direct replacement for the bandgap voltage reference in a CMOS process especially when substrate current is a concern. Performance of the BMVR with regard to temperature and process variations is covered. Experimental results from a 2-micron MOSIS test chip indicate that the BMVR can be tuned to within 10 mV of a desired value while maintaining a temperature coefficient below 1000 ppm/C and a supply sensitivity under 50 mV/V. |
| Author | Song Liu Baker, R.J. |
| Author_xml | – sequence: 1 surname: Song Liu fullname: Song Liu organization: Microelectron. Res. Center, Univ. of Idaho, Boise, ID, USA – sequence: 2 givenname: R.J. surname: Baker fullname: Baker, R.J. |
| BookMark | eNotj81KxDAUhQMqqGNfYFZ5gdabaTJJlkPxD2aoUMXlEG9upNI_0ozg21sYz-Z8i8MH55ZdDuNAjK0FFEKAvT98NNWuKYS1ptDKyo29YJnVBowwW2OF1Ncsm-dvWCLVBqC8YfVrHJHmmbvB80T9RNGlUyS-QBhj7wYkPgbueHWoG_5JyeX9qUvt1LUU-c_YJfdFPFKgSMv2jl0F182U_feKvT8-vFXP-b5-eql2-7wVWqbcBjIKFAEqD2AwoEQpAwKCUp6CQGm8V1ISBqFQatTeBrtVTpQAJMoVW5-9LREdp9j2Lv4ez6_LPwzrUH0 |
| ContentType | Conference Proceeding |
| DBID | 6IE 6IH CBEJK RIE RIO |
| DOI | 10.1109/MWSCAS.1998.759429 |
| DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Proceedings Order Plan (POP) 1998-present by volume IEEE Xplore All Conference Proceedings IEEE/IET Electronic Library IEEE Proceedings Order Plans (POP) 1998-present |
| DatabaseTitleList | |
| Database_xml | – sequence: 1 dbid: RIE name: IEEE/IET Electronic Library url: https://ieeexplore.ieee.org/ sourceTypes: Publisher |
| DeliveryMethod | fulltext_linktorsrc |
| EndPage | 36 |
| ExternalDocumentID | 759429 |
| GroupedDBID | 6IE 6IH 6IK 6IL AAJGR AAWTH ACGHX ALMA_UNASSIGNED_HOLDINGS BEFXN BFFAM BGNUA BKEBE BPEOZ CBEJK OCL RIB RIC RIE RIL RIO |
| ID | FETCH-LOGICAL-i174t-9fe8505e0c5d008cfc4c44fc0c055def1c48dd544ecf15c47c7d9f965a1300e13 |
| IEDL.DBID | RIE |
| ISBN | 9780818689147 0818689145 |
| ISICitedReferencesCount | 9 |
| ISICitedReferencesURI | http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000079563200008&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| IngestDate | Tue Aug 26 17:57:28 EDT 2025 |
| IsPeerReviewed | false |
| IsScholarly | true |
| Language | English |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-i174t-9fe8505e0c5d008cfc4c44fc0c055def1c48dd544ecf15c47c7d9f965a1300e13 |
| PageCount | 4 |
| ParticipantIDs | ieee_primary_759429 |
| PublicationCentury | 1900 |
| PublicationDate | 19980000 |
| PublicationDateYYYYMMDD | 1998-01-01 |
| PublicationDate_xml | – year: 1998 text: 19980000 |
| PublicationDecade | 1990 |
| PublicationTitle | Circuits and Systems; Proceedings: Midwest Symposium on Circuits and Systems |
| PublicationTitleAbbrev | MWSCAS |
| PublicationYear | 1998 |
| Publisher | IEEE |
| Publisher_xml | – name: IEEE |
| SSID | ssj0000452003 |
| Score | 1.5551461 |
| Snippet | The beta multiplier voltage reference (BMVR) is discussed as a direct replacement for the bandgap voltage reference in a CMOS process especially when substrate... |
| SourceID | ieee |
| SourceType | Publisher |
| StartPage | 33 |
| SubjectTerms | Circuits CMOS process Equations Immune system MOSFETs Photonic band gap Resistors Temperature sensors Threshold voltage Transconductance |
| Title | Process and temperature performance of a CMOS beta-multiplier voltage reference |
| URI | https://ieeexplore.ieee.org/document/759429 |
| WOSCitedRecordID | wos000079563200008&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlZ07T8MwEMctWjEw8SriLQ-sbhNqx_aIIioG-pAColtlzmepS1qVlM-P7aSpkFjYkgxWdLHu4rv7_46QByVsBi6ocXgKjD9Kw5SWmgWKTjLkwAVGZP6rnEzUfK5nDWc7amEQMTafYT9cxlq-XcE2pMoGUmjvPjukI2VWS7XadEogg_sNGgmPgQCvUy4avs7uXu40M4kejD-K_KkIUj3Vr1f9NV0lBpfR8b9e64T09iI9OmvDzyk5wPKcTJvGf2pKSwN2qmEm0_VeIEBXjhqaj6cF_cTKsKan0MdH6n1V5R0MbYeP9Mj76Pktf2HNzAS29GeLimmHyv_UYALC-vAODry9uYMEEiEsuhS4slZwjuBSAVyCtNrpTJhQ18J0eEG65arES0IlZuiX00b5IxUKp5VVUjkTaotgDVyRs2CLxbrGYixqM1z_-fSGHNVivpC7uCXdarPFO3II39Xya3MfP-UPlbGcgg |
| linkProvider | IEEE |
| linkToHtml | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlZ1LTwIxEMcbRRM9-cLguwevC7vS0vZoiAQjrwSM3EidThMuC8HFz2_bLRATL95299BsZpuZ7cz8f0PIo-SmBdarcVgGCXsSOpFKqMRTdNImA8YxIPN7YjCQ06kaRc520MIgYmg-w7q_DLV8s4C1T5U1BFfOfe6TAz84K4q1tgkVzwZ3WzQwHj0DXmWMR8LO5l5sVDOpavQ_xu3nsRfryXq57q_5KiG8dE7-9WKnpLqT6dHRNgCdkT3ML8gwtv5TnRvqwVORmkyXO4kAXViqabs_HNNPLHQSuwpdhKTOWxXOxdDt-JEqee-8TNrdJE5NSObudFEkyqJ0vzWYAjcuwIMFZ3FmIYWUc4M2AyaNcRZEsBkHJkAYZVWLa1_Zwqx5SSr5IscaoQJb6JZTWrpDFXKrpJFCWu2ri2A0XJFzb4vZsgRjzEozXP_59IEcdSf93qz3Oni7IceltM9nMm5JpVit8Y4cwncx_1rdh8_6A-4dn8s |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=Circuits+and+Systems%3B+Proceedings%3A+Midwest+Symposium+on+Circuits+and+Systems&rft.atitle=Process+and+temperature+performance+of+a+CMOS+beta-multiplier+voltage+reference&rft.au=Song+Liu&rft.au=Baker%2C+R.J.&rft.date=1998-01-01&rft.pub=IEEE&rft.isbn=9780818689147&rft.spage=33&rft.epage=36&rft_id=info:doi/10.1109%2FMWSCAS.1998.759429&rft.externalDocID=759429 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780818689147/lc.gif&client=summon&freeimage=true |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780818689147/mc.gif&client=summon&freeimage=true |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780818689147/sc.gif&client=summon&freeimage=true |