Process and temperature performance of a CMOS beta-multiplier voltage reference

The beta multiplier voltage reference (BMVR) is discussed as a direct replacement for the bandgap voltage reference in a CMOS process especially when substrate current is a concern. Performance of the BMVR with regard to temperature and process variations is covered. Experimental results from a 2-mi...

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Published in:Circuits and Systems; Proceedings: Midwest Symposium on Circuits and Systems pp. 33 - 36
Main Authors: Song Liu, Baker, R.J.
Format: Conference Proceeding
Language:English
Published: IEEE 1998
Subjects:
ISBN:9780818689147, 0818689145
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Abstract The beta multiplier voltage reference (BMVR) is discussed as a direct replacement for the bandgap voltage reference in a CMOS process especially when substrate current is a concern. Performance of the BMVR with regard to temperature and process variations is covered. Experimental results from a 2-micron MOSIS test chip indicate that the BMVR can be tuned to within 10 mV of a desired value while maintaining a temperature coefficient below 1000 ppm/C and a supply sensitivity under 50 mV/V.
AbstractList The beta multiplier voltage reference (BMVR) is discussed as a direct replacement for the bandgap voltage reference in a CMOS process especially when substrate current is a concern. Performance of the BMVR with regard to temperature and process variations is covered. Experimental results from a 2-micron MOSIS test chip indicate that the BMVR can be tuned to within 10 mV of a desired value while maintaining a temperature coefficient below 1000 ppm/C and a supply sensitivity under 50 mV/V.
Author Song Liu
Baker, R.J.
Author_xml – sequence: 1
  surname: Song Liu
  fullname: Song Liu
  organization: Microelectron. Res. Center, Univ. of Idaho, Boise, ID, USA
– sequence: 2
  givenname: R.J.
  surname: Baker
  fullname: Baker, R.J.
BookMark eNotj81KxDAUhQMqqGNfYFZ5gdabaTJJlkPxD2aoUMXlEG9upNI_0ozg21sYz-Z8i8MH55ZdDuNAjK0FFEKAvT98NNWuKYS1ptDKyo29YJnVBowwW2OF1Ncsm-dvWCLVBqC8YfVrHJHmmbvB80T9RNGlUyS-QBhj7wYkPgbueHWoG_5JyeX9qUvt1LUU-c_YJfdFPFKgSMv2jl0F182U_feKvT8-vFXP-b5-eql2-7wVWqbcBjIKFAEqD2AwoEQpAwKCUp6CQGm8V1ISBqFQatTeBrtVTpQAJMoVW5-9LREdp9j2Lv4ez6_LPwzrUH0
ContentType Conference Proceeding
DBID 6IE
6IH
CBEJK
RIE
RIO
DOI 10.1109/MWSCAS.1998.759429
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE
IEEE Proceedings Order Plans (POP) 1998-present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
EndPage 36
ExternalDocumentID 759429
GroupedDBID 6IE
6IH
6IK
6IL
AAJGR
AAWTH
ACGHX
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
OCL
RIB
RIC
RIE
RIL
RIO
ID FETCH-LOGICAL-i174t-9fe8505e0c5d008cfc4c44fc0c055def1c48dd544ecf15c47c7d9f965a1300e13
IEDL.DBID RIE
ISBN 9780818689147
0818689145
ISICitedReferencesCount 9
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000079563200008&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
IngestDate Tue Aug 26 17:57:28 EDT 2025
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i174t-9fe8505e0c5d008cfc4c44fc0c055def1c48dd544ecf15c47c7d9f965a1300e13
PageCount 4
ParticipantIDs ieee_primary_759429
PublicationCentury 1900
PublicationDate 19980000
PublicationDateYYYYMMDD 1998-01-01
PublicationDate_xml – year: 1998
  text: 19980000
PublicationDecade 1990
PublicationTitle Circuits and Systems; Proceedings: Midwest Symposium on Circuits and Systems
PublicationTitleAbbrev MWSCAS
PublicationYear 1998
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0000452003
Score 1.5551461
Snippet The beta multiplier voltage reference (BMVR) is discussed as a direct replacement for the bandgap voltage reference in a CMOS process especially when substrate...
SourceID ieee
SourceType Publisher
StartPage 33
SubjectTerms Circuits
CMOS process
Equations
Immune system
MOSFETs
Photonic band gap
Resistors
Temperature sensors
Threshold voltage
Transconductance
Title Process and temperature performance of a CMOS beta-multiplier voltage reference
URI https://ieeexplore.ieee.org/document/759429
WOSCitedRecordID wos000079563200008&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV07T8MwELZoxcDEq4i3PLC6jcGO4xFVVAz0IRVEtyo5n6UuaVVSfj9nJ22FxMJme7AsP-7l-75j7KGQPk1cJgU-5rlQ2ithSeyFTABH3hgZvS5S5r-Z0Sibzeyk4dmOWBhEjMln2A3N-JfvlrAJobKe0WGeFmsZk9ZQrV04JTCD0wWNDI-BAd5KpRt-nW3fbDEzie0NP6f952mA6mXdetZf1VWichkc_2tZJ6yzB-nxyU79nLIDLM_ZuEn853npeKCdajiT-WoPEOBLz3PeH46nvMAqF01OIelHTrKqIgHDd8VHOuxj8PLefxVNzQSxIN-iEtZjRkYNJqAdqXfwoEApDwkkWjv0ElTmnFYKwUsNyoBx1ttU5-FfC-XTBWuXyxIvGZeFMgq8A5misl4X9PwNkEOWeU1WkbtiZ2Ev5quaFmNeb8P1n6M37KgG84XYxS1rV-sN3rFD-K4WX-v7eJQ_BV2cIA
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LTwIxEG4UTfTkC-PbHrwWttjS7dEQCUZeCRi5kd3pNOGyS3Dx99t2F4iJF29tD00zbebV-b4h5Cnlth2ZmDNsJQkT0gqmndrzlQDGRWPO6TWBMr-vhsN4NtPjimc7YGEQMRSfYcMPw1--yWHtU2VNJf0---RACtGKSrDWNqHiucHdEw0cj54DXnMhK4adzVxtUDORbg4-J52XiQfrxY1y31_9VYJ56Z7862CnpL6D6dHx1gCdkT3MLsioKv2nSWaoJ56qWJPpcgcRoLmlCe0MRhOaYpGwqqrQWUjqtFXhVAzdth-pk4_u67TTY1XXBLZw0UXBtMXYuTUYgTTOwIMFAUJYiCCS0qDlIGJjnAQRLJcgFCijrW7LxP9sIX--JLUsz_CKUJ4KJcAa4G0U2srUKQAFLiSLrXR-kbkm514W82VJjDEvxXDz5-ojOepNB_15_234fkuOS2ifz2TckVqxWuM9OYTvYvG1egjX-gNWEp9n
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=Circuits+and+Systems%3B+Proceedings%3A+Midwest+Symposium+on+Circuits+and+Systems&rft.atitle=Process+and+temperature+performance+of+a+CMOS+beta-multiplier+voltage+reference&rft.au=Song+Liu&rft.au=Baker%2C+R.J.&rft.date=1998-01-01&rft.pub=IEEE&rft.isbn=9780818689147&rft.spage=33&rft.epage=36&rft_id=info:doi/10.1109%2FMWSCAS.1998.759429&rft.externalDocID=759429
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780818689147/lc.gif&client=summon&freeimage=true
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780818689147/mc.gif&client=summon&freeimage=true
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780818689147/sc.gif&client=summon&freeimage=true