Proceedings : IEEE Workshop on Visualization and Machine Vision, June 24, 1994, Seattle, Washington

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Bibliographic Details
Main Authors: IEEE Workshop on Visualization and Machine Vision, IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis, IEEE Computer Society. Technical Committee--Computer Graphics
Format: Book
Language:English
Published: Los Alamitos, CA IEEE Computer Society Press 1994
Subjects:
Computer vision > Congresses
ISBN:0818658754, 9780818658754, 9780818658761, 0818658762
Online Access:Get full text
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ISBN:0818658754
9780818658754
9780818658761
0818658762