Analytical Modeling and Numerical Simulation of Nonlinear Thermal Effects in Bipolar Transistors

This paper addresses the problem of modeling nonlinear thermal effects in bipolar transistors under static conditions. The impact of these effects on the thermal resistance is explained in detail and analytically modeled using the assumption of a single-semiconductor device. FEM thermal simulations...

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Vydané v:	Collection of papers presented at the ... International Workshop on Thermal Investigations of ICs and Systems s. 1 - 7
Hlavní autori:	D'Alessandro, Vincenzo, Scognamillo, Ciro, Catalano, Antonio Pio, Muller, Markus, Schroter, Michael, Zampardi, Peter J., Codecasa, Lorenzo
Médium:	Konferenčný príspevok..
Jazyk:	English
Vydavateľské údaje:	IEEE 28.09.2022
Predmet:	Analytical models Bipolar transistors Numerical models Performance evaluation Solid modeling Thermal analysis Thermal resistance
ISSN:	2474-1523
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