Chakole, S. S., Khera, S., & Ukani, N. A. (2022, December 23). Analysis of Plant Leaf Disease Based on Sensor and Machine Learning Technique. 2022 IEEE International Conference on Current Development in Engineering and Technology (CCET), 1-4. https://doi.org/10.1109/CCET56606.2022.10080352
Citácia podle Chicago (17th ed.)Chakole, Saurabh S., Shelej Khera, a Neema Amish Ukani. "Analysis of Plant Leaf Disease Based on Sensor and Machine Learning Technique." 2022 IEEE International Conference on Current Development in Engineering and Technology (CCET) 23 Dec. 2022: 1-4. https://doi.org/10.1109/CCET56606.2022.10080352.
Citácia podľa MLA (8th ed.)Chakole, Saurabh S., et al. "Analysis of Plant Leaf Disease Based on Sensor and Machine Learning Technique." 2022 IEEE International Conference on Current Development in Engineering and Technology (CCET), 23 Dec. 2022, pp. 1-4, https://doi.org/10.1109/CCET56606.2022.10080352.