Chakole, S. S., Khera, S., & Ukani, N. A. (2022, December 23). Analysis of Plant Leaf Disease Based on Sensor and Machine Learning Technique. 2022 IEEE International Conference on Current Development in Engineering and Technology (CCET), 1-4. https://doi.org/10.1109/CCET56606.2022.10080352
Chicago-Zitierstil (17. Ausg.)Chakole, Saurabh S., Shelej Khera, und Neema Amish Ukani. "Analysis of Plant Leaf Disease Based on Sensor and Machine Learning Technique." 2022 IEEE International Conference on Current Development in Engineering and Technology (CCET) 23 Dec. 2022: 1-4. https://doi.org/10.1109/CCET56606.2022.10080352.
MLA-Zitierstil (9. Ausg.)Chakole, Saurabh S., et al. "Analysis of Plant Leaf Disease Based on Sensor and Machine Learning Technique." 2022 IEEE International Conference on Current Development in Engineering and Technology (CCET), 23 Dec. 2022, pp. 1-4, https://doi.org/10.1109/CCET56606.2022.10080352.