Chakole, S. S., Khera, S., & Ukani, N. A. (2022, December 23). Analysis of Plant Leaf Disease Based on Sensor and Machine Learning Technique. 2022 IEEE International Conference on Current Development in Engineering and Technology (CCET), 1-4. https://doi.org/10.1109/CCET56606.2022.10080352
Citace podle Chicago (17th ed.)Chakole, Saurabh S., Shelej Khera, a Neema Amish Ukani. "Analysis of Plant Leaf Disease Based on Sensor and Machine Learning Technique." 2022 IEEE International Conference on Current Development in Engineering and Technology (CCET) 23 Dec. 2022: 1-4. https://doi.org/10.1109/CCET56606.2022.10080352.
Citace podle MLA (9th ed.)Chakole, Saurabh S., et al. "Analysis of Plant Leaf Disease Based on Sensor and Machine Learning Technique." 2022 IEEE International Conference on Current Development in Engineering and Technology (CCET), 23 Dec. 2022, pp. 1-4, https://doi.org/10.1109/CCET56606.2022.10080352.