APA (7th ed.) Citation

Ajikaran, R., Hewarathna, A. I., Palanisamy, V., Joseph, C., & Thuseethan, S. (2023, August 25). An Image Analysis-Based Automated Method using Deep Learning for Grain Counting. 2023 IEEE 17th International Conference on Industrial and Information Systems (ICIIS), 25-30. https://doi.org/10.1109/ICIIS58898.2023.10253539

Chicago Style (17th ed.) Citation

Ajikaran, Ramesh, Ashen Iranga Hewarathna, Vigneshwaran Palanisamy, Charles Joseph, and Selvarajah Thuseethan. "An Image Analysis-Based Automated Method Using Deep Learning for Grain Counting." 2023 IEEE 17th International Conference on Industrial and Information Systems (ICIIS) 25 Aug. 2023: 25-30. https://doi.org/10.1109/ICIIS58898.2023.10253539.

MLA (9th ed.) Citation

Ajikaran, Ramesh, et al. "An Image Analysis-Based Automated Method Using Deep Learning for Grain Counting." 2023 IEEE 17th International Conference on Industrial and Information Systems (ICIIS), 25 Aug. 2023, pp. 25-30, https://doi.org/10.1109/ICIIS58898.2023.10253539.