Wave-Based Neural Network with Attention Mechanism for Damage Localization in Materials

Cracks are omnipresent in materials and lead to billions of dollars in losses annually due to catastrophic and spectacular failures. Nondestructive wave-based methods are used to identify cracks, but these methods are cumbersome and require experts, leading to limited investigation. This research pr...

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Bibliographic Details
Published in:Proceedings (IEEE International Conference on Emerging Technologies and Factory Automation) pp. 122 - 129
Main Authors: Moreh, Fatahlla, Hasan, Yusuf, Rizvi, Zarghaam Haider, Wuttke, Frank, Tomforde, Sven
Format: Conference Proceeding
Language:English
Published: IEEE 18.12.2024
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ISSN:1946-0759
Online Access:Get full text
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