APA (7th ed.) Citation

Blanton, R., & Hayes, J. (1997). Properties of the input pattern fault model. Proceedings International Conference on Computer Design VLSI in Computers and Processors, 372-380. https://doi.org/10.1109/ICCD.1997.628897

Chicago Style (17th ed.) Citation

Blanton, R.D, and J.P Hayes. "Properties of the Input Pattern Fault Model." Proceedings International Conference on Computer Design VLSI in Computers and Processors 1997: 372-380. https://doi.org/10.1109/ICCD.1997.628897.

MLA (9th ed.) Citation

Blanton, R.D, and J.P Hayes. "Properties of the Input Pattern Fault Model." Proceedings International Conference on Computer Design VLSI in Computers and Processors, 1997, pp. 372-380, https://doi.org/10.1109/ICCD.1997.628897.