Demirag, Y., Moro, F., Dalgaty, T., Navarro, G., Frenkel, C., Indiveri, G., . . . Payvand, M. (2021, May). PCM-Trace: Scalable Synaptic Eligibility Traces with Resistivity Drift of Phase-Change Materials. IEEE International Symposium on Circuits and Systems proceedings, 1-5. https://doi.org/10.1109/ISCAS51556.2021.9401446
Citácia podle Chicago (17th ed.)Demirag, Yigit, Filippo Moro, Thomas Dalgaty, Gabriele Navarro, Charlotte Frenkel, Giacomo Indiveri, Elisa Vianello, a Melika Payvand. "PCM-Trace: Scalable Synaptic Eligibility Traces with Resistivity Drift of Phase-Change Materials." IEEE International Symposium on Circuits and Systems Proceedings May. 2021: 1-5. https://doi.org/10.1109/ISCAS51556.2021.9401446.
Citácia podľa MLA (8th ed.)Demirag, Yigit, et al. "PCM-Trace: Scalable Synaptic Eligibility Traces with Resistivity Drift of Phase-Change Materials." IEEE International Symposium on Circuits and Systems Proceedings, May. 2021, pp. 1-5, https://doi.org/10.1109/ISCAS51556.2021.9401446.