Proceedings : IEEE Conference on Computer Vision and Pattern Recognition, Hilton Head Island, South Carolina, June 13-15, 2000

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Bibliographic Details
Main Authors: IEEE Computer Society Conference on Computer Vision and Pattern Recognition, IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis
Format: Book
Language:English
Published: Los Alamitos IEEE Computer Society Press 2000
Subjects:
Computer vision > Congresses
Pattern recognition systems > Congresses
ISBN:9780769506623, 0780365275, 0769506623, 9780780365278
Online Access:Get full text
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