Optimum Life Test Plans of Electrical Insulation for Thermal Stress

We search for the optimum life test plans of electrical insulation for thermal stress assuming that the Arrhenius law holds between the thermal stress and the lifetime, and that the logarithmic lifetime follows some consistent probability distributions at a constant stress. The optimization target i...

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Veröffentlicht in:Lecture notes in engineering and computer science Jg. 2; S. 668 - 672
Hauptverfasser: Hirose, Hideo, Sakumura, Takenori, Tabuchi, Naoki, Kiyosue, Takeru
Format: Journal Article
Sprache:Englisch
Veröffentlicht: 01.01.2014
Schlagworte:
Confidence intervals
Constants
Electrical insulation
Error analysis
Optimization
Stresses
Test procedures
Thermal stresses
ISBN:9789881925336, 9881925339
ISSN:2078-0958, 2078-0966
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Abstract We search for the optimum life test plans of electrical insulation for thermal stress assuming that the Arrhenius law holds between the thermal stress and the lifetime, and that the logarithmic lifetime follows some consistent probability distributions at a constant stress. The optimization target is to find the optimum number of test specimens at each test stress level, and we consider the case of the number of stress level is three. The criterion for optimality is measured by the root mean squared error for the lifetime in use condition. To take into account the reality, we used the parameter values in a real experimental case. Comparing the optimum results with those using the conventional test method where test specimens are equally allocated to each test stress level, we have found that the confidence interval for the predicted value in the optimum case becomes around 80-85% of that in the conventional test. However, there is only a small difference between the optimum test result and the conventional test result if linearity of the Arrhenius plot is required. It would be useful to know the semi-optimum test plan in which the efficiency is close to that in the optimum one and the test condition is simple. In that sense, we have found that we may regard the conventional test plan as one of the semi-optimum test plans.
AbstractList We search for the optimum life test plans of electrical insulation for thermal stress assuming that the Arrhenius law holds between the thermal stress and the lifetime, and that the logarithmic lifetime follows some consistent probability distributions at a constant stress. The optimization target is to find the optimum number of test specimens at each test stress level, and we consider the case of the number of stress level is three. The criterion for optimality is measured by the root mean squared error for the lifetime in use condition. To take into account the reality, we used the parameter values in a real experimental case. Comparing the optimum results with those using the conventional test method where test specimens are equally allocated to each test stress level, we have found that the confidence interval for the predicted value in the optimum case becomes around 80-85% of that in the conventional test. However, there is only a small difference between the optimum test result and the conventional test result if linearity of the Arrhenius plot is required. It would be useful to know the semi-optimum test plan in which the efficiency is close to that in the optimum one and the test condition is simple. In that sense, we have found that we may regard the conventional test plan as one of the semi-optimum test plans.
Author Sakumura, Takenori
Kiyosue, Takeru
Tabuchi, Naoki
Hirose, Hideo
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Snippet We search for the optimum life test plans of electrical insulation for thermal stress assuming that the Arrhenius law holds between the thermal stress and the...
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StartPage 668
SubjectTerms Confidence intervals
Constants
Electrical insulation
Error analysis
Optimization
Stresses
Test procedures
Thermal stresses
Title Optimum Life Test Plans of Electrical Insulation for Thermal Stress
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