Salonina, E. A., Belyaev, Y. V., & Piatak, I. M. (2020). Modeling the impact of technological process variations on R-2R DAC static characteristics. St. Petersburg State Polytechnical University Journal. Computer Science. Telecommunications and Control Systems, 13(3), 55. https://doi.org/10.18721/JCSTCS.13305
Chicago-Zitierstil (17. Ausg.)Salonina, Ekaterina A., Yakov V. Belyaev, und Ivan M. Piatak. "Modeling the Impact of Technological Process Variations on R-2R DAC Static Characteristics." St. Petersburg State Polytechnical University Journal. Computer Science. Telecommunications and Control Systems 13, no. 3 (2020): 55. https://doi.org/10.18721/JCSTCS.13305.
MLA-Zitierstil (9. Ausg.)Salonina, Ekaterina A., et al. "Modeling the Impact of Technological Process Variations on R-2R DAC Static Characteristics." St. Petersburg State Polytechnical University Journal. Computer Science. Telecommunications and Control Systems, vol. 13, no. 3, 2020, p. 55, https://doi.org/10.18721/JCSTCS.13305.