Deep learning framework for analyzing birefringence imaging by incorporating optical polarization overlap in stress-induced ferroelectric SrTiO3

Optical microscopy is vital in many scientific fields, and various super-resolution techniques have been developed to overcome the resolution limit that restricts the separation of spatially mixed light. However, conventional methods inherently cannot resolve overlapping optical polarization (OP) co...

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Bibliographic Details
Published in:Science and technology of advanced materials. Methods Vol. 5; no. 1
Main Authors: Hirotaka Manaka, Shoutarou Katayama, Soichiro Honda, Yoko Miura
Format: Journal Article
Language:English
Published: Taylor & Francis Group 31.12.2025
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ISSN:2766-0400
Online Access:Get full text
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