APA (7th ed.) Citation

Savalam, C., Medisetti, S., & Korapati, P. (2026). Enhanced fault detection in digital VLSI circuits using convolutional autoencoders. Integration (Amsterdam), 107, 102608. https://doi.org/10.1016/j.vlsi.2025.102608

Chicago Style (17th ed.) Citation

Savalam, Chandrasekhar, Sanjay Medisetti, and Prasanti Korapati. "Enhanced Fault Detection in Digital VLSI Circuits Using Convolutional Autoencoders." Integration (Amsterdam) 107 (2026): 102608. https://doi.org/10.1016/j.vlsi.2025.102608.

MLA (9th ed.) Citation

Savalam, Chandrasekhar, et al. "Enhanced Fault Detection in Digital VLSI Circuits Using Convolutional Autoencoders." Integration (Amsterdam), vol. 107, 2026, p. 102608, https://doi.org/10.1016/j.vlsi.2025.102608.