Savalam, C., Medisetti, S., & Korapati, P. (2026). Enhanced fault detection in digital VLSI circuits using convolutional autoencoders. Integration (Amsterdam), 107, 102608. https://doi.org/10.1016/j.vlsi.2025.102608
Citace podle Chicago (17th ed.)Savalam, Chandrasekhar, Sanjay Medisetti, a Prasanti Korapati. "Enhanced Fault Detection in Digital VLSI Circuits Using Convolutional Autoencoders." Integration (Amsterdam) 107 (2026): 102608. https://doi.org/10.1016/j.vlsi.2025.102608.
Citace podle MLA (9th ed.)Savalam, Chandrasekhar, et al. "Enhanced Fault Detection in Digital VLSI Circuits Using Convolutional Autoencoders." Integration (Amsterdam), vol. 107, 2026, p. 102608, https://doi.org/10.1016/j.vlsi.2025.102608.
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