Converse flexoelectricity yields large piezoresponse force microscopy signals in non-piezoelectric materials
Converse flexoelectricity is a mechanical stress induced by an electric polarization gradient. It can appear in any material, irrespective of symmetry, whenever there is an inhomogeneous electric field distribution. This situation invariably happens in piezoresponse force microscopy (PFM), which is...
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| Vydané v: | Nature communications Ročník 10; číslo 1; s. 1266 - 6 |
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| Hlavní autori: | , , , |
| Médium: | Journal Article Publikácia |
| Jazyk: | English |
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Nature Publishing Group UK
20.03.2019
Nature Publishing Group Nature Portfolio |
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| ISSN: | 2041-1723, 2041-1723 |
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| Abstract | Converse flexoelectricity is a mechanical stress induced by an electric polarization gradient. It can appear in any material, irrespective of symmetry, whenever there is an inhomogeneous electric field distribution. This situation invariably happens in piezoresponse force microscopy (PFM), which is a technique whereby a voltage is delivered to the tip of an atomic force microscope in order to stimulate and probe piezoelectricity at the nanoscale. While PFM is the premier technique for studying ferroelectricity and piezoelectricity at the nanoscale, here we show, theoretically and experimentally, that large effective piezoelectric coefficients can be measured in non-piezoelectric dielectrics due to converse flexoelectricity.
Piezoresponse force microscopy (PFM) is widely used to study piezoelectric properties of materials. Here, the authors not only show that PFM measurements will yield a signal even in non-piezoelectric materials via induced flexoelectricity, but also introduce a protocol to distinguish these from real signals. |
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| AbstractList | Converse flexoelectricity is a mechanical stress induced by an electric polarization gradient. It can appear in any material, irrespective of symmetry, whenever there is an inhomogeneous electric field distribution. This situation invariably happens in piezoresponse force microscopy (PFM), which is a technique whereby a voltage is delivered to the tip of an atomic force microscope in order to stimulate and probe piezoelectricity at the nanoscale. While PFM is the premier technique for studying ferroelectricity and piezoelectricity at the nanoscale, here we show, theoretically and experimentally, that large effective piezoelectric coefficients can be measured in non-piezoelectric dielectrics due to converse flexoelectricity. Converse flexoelectricity is a mechanical stress induced by an electric polarization gradient. It can appear in any material, irrespective of symmetry, whenever there is an inhomogeneous electric field distribution. This situation invariably happens in piezoresponse force microscopy (PFM), which is a technique whereby a voltage is delivered to the tip of an atomic force microscope in order to stimulate and probe piezoelectricity at the nanoscale. While PFM is the premier technique for studying ferroelectricity and piezoelectricity at the nanoscale, here we show, theoretically and experimentally, that large effective piezoelectric coefficients can be measured in non-piezoelectric dielectrics due to converse flexoelectricity. Piezoresponse force microscopy (PFM) is widely used to study piezoelectric properties of materials. Here, the authors not only show that PFM measurements will yield a signal even in non-piezoelectric materials via induced flexoelectricity, but also introduce a protocol to distinguish these from real signals. Converse flexoelectricity is a mechanical stress induced by an electric polarization gradient. It can appear in any material, irrespective of symmetry, whenever there is an inhomogeneous electric field distribution. This situation invariably happens in piezoresponse force microscopy (PFM), which is a technique whereby a voltage is delivered to the tip of an atomic force microscope in order to stimulate and probe piezoelectricity at the nanoscale. While PFM is the premier technique for studying ferroelectricity and piezoelectricity at the nanoscale, here we show, theoretically and experimentally, that large effective piezoelectric coefficients can be measured in non-piezoelectric dielectrics due to converse flexoelectricity.Converse flexoelectricity is a mechanical stress induced by an electric polarization gradient. It can appear in any material, irrespective of symmetry, whenever there is an inhomogeneous electric field distribution. This situation invariably happens in piezoresponse force microscopy (PFM), which is a technique whereby a voltage is delivered to the tip of an atomic force microscope in order to stimulate and probe piezoelectricity at the nanoscale. While PFM is the premier technique for studying ferroelectricity and piezoelectricity at the nanoscale, here we show, theoretically and experimentally, that large effective piezoelectric coefficients can be measured in non-piezoelectric dielectrics due to converse flexoelectricity. Converse flexoelectricity is a mechanical stress induced by an electric polarization gradient. It can appear in any material, irrespective of symmetry, whenever there is an inhomogeneous electric field distribution. This situation invariably happens in piezoresponse force microscopy (PFM), which is a technique whereby a voltage is delivered to the tip of an atomic force microscope in order to stimulate and probe piezoelectricity at the nanoscale. While PFM is the premier technique for studying ferroelectricity and piezoelectricity at the nanoscale, here we show, theoretically and experimentally, that large effective piezoelectric coefficients can be measured in non-piezoelectric dielectrics due to converse flexoelectricity. Peer Reviewed Converse flexoelectricity is a mechanical stress induced by an electric polarization gradient. It can appear in any material, irrespective of symmetry, whenever there is an inhomogeneous electric field distribution. This situation invariably happens in piezoresponse force microscopy (PFM), which is a technique whereby a voltage is delivered to the tip of an atomic force microscope in order to stimulate and probe piezoelectricity at the nanoscale. While PFM is the premier technique for studying ferroelectricity and piezoelectricity at the nanoscale, here we show, theoretically and experimentally, that large effective piezoelectric coefficients can be measured in non-piezoelectric dielectrics due to converse flexoelectricity. Piezoresponse force microscopy (PFM) is widely used to study piezoelectric properties of materials. Here, the authors not only show that PFM measurements will yield a signal even in non-piezoelectric materials via induced flexoelectricity, but also introduce a protocol to distinguish these from real signals. Piezoresponse force microscopy (PFM) is widely used to study piezoelectric properties of materials. Here, the authors not only show that PFM measurements will yield a signal even in non-piezoelectric materials via induced flexoelectricity, but also introduce a protocol to distinguish these from real signals. |
| ArticleNumber | 1266 |
| Author | Catalan, Gustau Abdollahi, Amir Arias, Irene Domingo, Neus |
| Author_xml | – sequence: 1 givenname: Amir orcidid: 0000-0003-0363-4984 surname: Abdollahi fullname: Abdollahi, Amir email: amir.abdollahi@upc.edu organization: Laboratori de Càlcul Numèric (LaCàN), Universitat Politècnica de Catalunya (UPC) – sequence: 2 givenname: Neus orcidid: 0000-0002-5229-6638 surname: Domingo fullname: Domingo, Neus email: neus.domingo@icn2.cat organization: Catalan Institute of Nanoscience and Nanotechnology (ICN2), CSIC and The Barcelona Institute of Science and Technology – sequence: 3 givenname: Irene orcidid: 0000-0002-6761-3499 surname: Arias fullname: Arias, Irene organization: Laboratori de Càlcul Numèric (LaCàN), Universitat Politècnica de Catalunya (UPC) – sequence: 4 givenname: Gustau surname: Catalan fullname: Catalan, Gustau organization: Catalan Institute of Nanoscience and Nanotechnology (ICN2), CSIC and The Barcelona Institute of Science and Technology, ICREA-Institut Catala de Recerca i Estudis Avançats |
| BackLink | https://www.ncbi.nlm.nih.gov/pubmed/30894544$$D View this record in MEDLINE/PubMed |
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| Contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Civil i Ambiental Universitat Politècnica de Catalunya. LACÀN - Mètodes Numèrics en Ciències Aplicades i Enginyeria |
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| Snippet | Converse flexoelectricity is a mechanical stress induced by an electric polarization gradient. It can appear in any material, irrespective of symmetry,... Piezoresponse force microscopy (PFM) is widely used to study piezoelectric properties of materials. Here, the authors not only show that PFM measurements will... |
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| Title | Converse flexoelectricity yields large piezoresponse force microscopy signals in non-piezoelectric materials |
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