Wang, L., Li, B., Hu, B., Shen, G., Zheng, Y., & Zheng, Y. (2022). Failure mode effect and criticality analysis of ultrasound device by classification tracking. BMC health services research, 22(1), 429-10. https://doi.org/10.1186/s12913-022-07843-4
Citácia podle Chicago (17th ed.)Wang, Longchen, Bin Li, Bing Hu, Guofeng Shen, Yunxin Zheng, a Yuanyi Zheng. "Failure Mode Effect and Criticality Analysis of Ultrasound Device by Classification Tracking." BMC Health Services Research 22, no. 1 (2022): 429-10. https://doi.org/10.1186/s12913-022-07843-4.
Citácia podľa MLA (8th ed.)Wang, Longchen, et al. "Failure Mode Effect and Criticality Analysis of Ultrasound Device by Classification Tracking." BMC Health Services Research, vol. 22, no. 1, 2022, pp. 429-10, https://doi.org/10.1186/s12913-022-07843-4.