A Bayesian approach to beam-induced motion correction in cryo-EM single-particle analysis

A new method to estimate the trajectories of particle motion and the amount of cumulative beam damage in electron cryo-microscopy (cryo-EM) single-particle analysis is presented. The motion within the sample is modelled through the use of Gaussian process regression. This allows a prior likelihood t...

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Vydané v:	IUCrJ Ročník 6; číslo 1; s. 5 - 17
Hlavní autori:	Zivanov, Jasenko, Nakane, Takanori, Scheres, Sjors H. W.
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	England International Union of Crystallography 01.01.2019
Predmet:	Algorithms Bayesian analysis Bayesian particle polishing beam-induced motion correction cryo-EM Damage assessment electron cryo-microscopy Gaussian process Microscopy Parameter estimation Particle motion Particle trajectories Polishing Radiation (Physics) Radiation damage Radiation dosage Regression analysis Research Papers single-particle analysis Smoothness State of the art Trajectory analysis electron cryo-microscopy Bayesian particle polishing beam-induced motion correction cryo-EM single-particle analysis
ISSN:	2052-2525, 2052-2525
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