XFELs for structure and dynamics in biology

The development and application of the free-electron X-ray laser (XFEL) to structure and dynamics in biology since its inception in 2009 are reviewed. The research opportunities which result from the ability to outrun most radiation-damage effects are outlined, and some grand challenges are suggeste...

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Bibliographic Details
Published in:IUCrJ Vol. 4; no. 4; pp. 322 - 339
Main Author: Spence, J. C. H.
Format: Journal Article
Language:English
Published: England International Union of Crystallography 01.07.2017
Subjects:
Algorithms
Biological effects
Biology
Crystallography
Data processing
dynamics
Free electron lasers
Free electrons
Molecular machines
Photosensitivity
Physiological effects
Radiation damage
structure
Thermal baths
Thermal imaging
X ray lasers
X-ray scattering
XFELs
dynamics
biology
XFELs
structure
X-ray lasers
ISSN:2052-2525, 2052-2525
Online Access:Get full text
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Summary:The development and application of the free-electron X-ray laser (XFEL) to structure and dynamics in biology since its inception in 2009 are reviewed. The research opportunities which result from the ability to outrun most radiation-damage effects are outlined, and some grand challenges are suggested. By avoiding the need to cool samples to minimize damage, the XFEL has permitted atomic resolution imaging of molecular processes on the 100 fs timescale under near-physiological conditions and in the correct thermal bath in which molecular machines operate. Radiation damage, comparisons of XFEL and synchrotron work, single-particle diffraction, fast solution scattering, pump–probe studies on photosensitive proteins, mix-and-inject experiments, caged molecules, pH jump and other reaction-initiation methods, and the study of molecular machines are all discussed. Sample-delivery methods and data-analysis algorithms for the various modes, from serial femtosecond crystallography to fast solution scattering, fluctuation X-ray scattering, mixing jet experiments and single-particle diffraction, are also reviewed.
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ISSN:2052-2525
2052-2525
DOI:10.1107/S2052252517005760