What Can Electron Microscopy Tell Us Beyond Crystal Structures?

Transmission electron microscopy is a powerful tool to directly image crystal structures. Not only that, it is often used to reveal crystal size and morphology, crystal orientation, crystal defects, surface structures, superstructures, etc. However, due to the 2D nature of TEM images, it is easy to...

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Vydáno v:European journal of inorganic chemistry Ročník 2016; číslo 7; s. 941 - 950
Hlavní autoři: Zhou, Wuzong, Greer, Heather F.
Médium: Journal Article
Jazyk:angličtina
Vydáno: Weinheim WILEY-VCH Verlag 01.03.2016
WILEY‐VCH Verlag
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Témata:
Crystal defects
Crystal growth
Crystal structure
Crystals
Electron diffraction
Electron microscopes
Electron microscopy
Morphology
Nanostructures
Scanning electron microscopy
Solid-state structures
Three dimensional
Transmission electron microscopy
ISSN:1434-1948, 1099-0682
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Shrnutí:Transmission electron microscopy is a powerful tool to directly image crystal structures. Not only that, it is often used to reveal crystal size and morphology, crystal orientation, crystal defects, surface structures, superstructures, etc. However, due to the 2D nature of TEM images, it is easy to make mistakes when we try to recover a 3D structure from them. Scanning electron microscopy is able to provide information on the particle size, morphology and surface topography. However, obtaining information on crystallinity of particles using SEM is difficult. In this microreview article, some practical cases of transmission and scanning electron microscopy investigations of inorganic crystals are reviewed. Commonly occurring uncertainties, imperfection and misunderstandings are discussed. Some examples of conventional SEM and TEM studies of inorganic crystals are reviewed. Typical problems of misinterpretation of the images are discussed.
Bibliografie:istex:6C86E23F9447989B49FBF572932CCA563F576F0B
ArticleID:EJIC201501342
Funded Access
ark:/67375/WNG-Q1GX0KSN-D
ObjectType-Article-1
SourceType-Scholarly Journals-1
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ISSN:1434-1948
1099-0682
DOI:10.1002/ejic.201501342