Inverting dynamic force microscopy: from signals to time-resolved interaction forces

Transient forces between nanoscale objects on surfaces govern friction, viscous flow, and plastic deformation, occur during manipulation of matter, or mediate the local wetting behavior of thin films. To resolve transient forces on the (sub) microsecond time and nanometer length scale, dynamic atomi...

Celý popis

Uložené v:
Podrobná bibliografia
Vydané v:Proceedings of the National Academy of Sciences - PNAS Ročník 99; číslo 13; s. 8473
Hlavní autori: Stark, Martin, Stark, Robert W, Heckl, Wolfgang M, Guckenberger, Reinhard
Médium: Journal Article
Jazyk:English
Vydavateľské údaje: United States 25.06.2002
Predmet:
ISSN:0027-8424
On-line prístup:Zistit podrobnosti o prístupe
Tagy: Pridať tag
Žiadne tagy, Buďte prvý, kto otaguje tento záznam!
Abstract Transient forces between nanoscale objects on surfaces govern friction, viscous flow, and plastic deformation, occur during manipulation of matter, or mediate the local wetting behavior of thin films. To resolve transient forces on the (sub) microsecond time and nanometer length scale, dynamic atomic force microscopy (AFM) offers largely unexploited potential. Full spectral analysis of the AFM signal completes dynamic AFM. Inverting the signal formation process, we measure the time course of the force effective at the sensing tip. This approach yields rich insight into processes at the tip and dispenses with a priori assumptions about the interaction, as it relies solely on measured data. Force measurements on silicon under ambient conditions demonstrate the distinct signature of the interaction and reveal that peak forces exceeding 200 nN are applied to the sample in a typical imaging situation. These forces are 2 orders of magnitude higher than those in covalent bonds.
AbstractList Transient forces between nanoscale objects on surfaces govern friction, viscous flow, and plastic deformation, occur during manipulation of matter, or mediate the local wetting behavior of thin films. To resolve transient forces on the (sub) microsecond time and nanometer length scale, dynamic atomic force microscopy (AFM) offers largely unexploited potential. Full spectral analysis of the AFM signal completes dynamic AFM. Inverting the signal formation process, we measure the time course of the force effective at the sensing tip. This approach yields rich insight into processes at the tip and dispenses with a priori assumptions about the interaction, as it relies solely on measured data. Force measurements on silicon under ambient conditions demonstrate the distinct signature of the interaction and reveal that peak forces exceeding 200 nN are applied to the sample in a typical imaging situation. These forces are 2 orders of magnitude higher than those in covalent bonds.
Transient forces between nanoscale objects on surfaces govern friction, viscous flow, and plastic deformation, occur during manipulation of matter, or mediate the local wetting behavior of thin films. To resolve transient forces on the (sub) microsecond time and nanometer length scale, dynamic atomic force microscopy (AFM) offers largely unexploited potential. Full spectral analysis of the AFM signal completes dynamic AFM. Inverting the signal formation process, we measure the time course of the force effective at the sensing tip. This approach yields rich insight into processes at the tip and dispenses with a priori assumptions about the interaction, as it relies solely on measured data. Force measurements on silicon under ambient conditions demonstrate the distinct signature of the interaction and reveal that peak forces exceeding 200 nN are applied to the sample in a typical imaging situation. These forces are 2 orders of magnitude higher than those in covalent bonds.Transient forces between nanoscale objects on surfaces govern friction, viscous flow, and plastic deformation, occur during manipulation of matter, or mediate the local wetting behavior of thin films. To resolve transient forces on the (sub) microsecond time and nanometer length scale, dynamic atomic force microscopy (AFM) offers largely unexploited potential. Full spectral analysis of the AFM signal completes dynamic AFM. Inverting the signal formation process, we measure the time course of the force effective at the sensing tip. This approach yields rich insight into processes at the tip and dispenses with a priori assumptions about the interaction, as it relies solely on measured data. Force measurements on silicon under ambient conditions demonstrate the distinct signature of the interaction and reveal that peak forces exceeding 200 nN are applied to the sample in a typical imaging situation. These forces are 2 orders of magnitude higher than those in covalent bonds.
Author Heckl, Wolfgang M
Guckenberger, Reinhard
Stark, Martin
Stark, Robert W
Author_xml – sequence: 1
  givenname: Martin
  surname: Stark
  fullname: Stark, Martin
  email: stark@biochem.mpg.de
  organization: Max-Planck-Institut für Biochemie, Abteilung Molekulare Strukturbiologie, Am Klopferspitz 18a, D-82152 Martinsried, Germany. stark@biochem.mpg.de
– sequence: 2
  givenname: Robert W
  surname: Stark
  fullname: Stark, Robert W
– sequence: 3
  givenname: Wolfgang M
  surname: Heckl
  fullname: Heckl, Wolfgang M
– sequence: 4
  givenname: Reinhard
  surname: Guckenberger
  fullname: Guckenberger, Reinhard
BackLink https://www.ncbi.nlm.nih.gov/pubmed/12070341$$D View this record in MEDLINE/PubMed
BookMark eNo1kDtPwzAUhT0U0QesjMgTW8r1I03ChioelSqxlDmynevKKLGD7Vbqv6dSy3TO8H1nOHMy8cEjIQ8Mlgwq8Tx6lZaMc5BQNs2EzAB4VdSSyymZp_QDAE1Zwy2ZMg4VCMlmZLfxR4zZ-T3tTl4NzlAbokF6bjEkE8bTC7UxDDS5vVd9ojnQ7AYsIqbQH7GjzmeMymQX_MVNd-TGnlG8v-aCfL-_7dafxfbrY7N-3RamLGUuhFFSK9PUK2kQwFSlRmBaMq4b2TFdotCqBGG5VkJoo4UAQKwt411j0fIFebrsjjH8HjDldnDJYN8rj-GQ2orVK-AgzuDjFTzoAbt2jG5Q8dT-_8D_AB-AYZE
CitedBy_id crossref_primary_10_1021_ja051642v
crossref_primary_10_3762_bjnano_7_49
crossref_primary_10_1063_1_2166469
crossref_primary_10_1088_0957_4484_27_41_414003
crossref_primary_10_1021_nn505345c
crossref_primary_10_1088_0957_4484_25_48_485708
crossref_primary_10_1088_1361_6463_aaa55d
crossref_primary_10_3762_bjnano_11_37
crossref_primary_10_1038_nprot_2014_070
crossref_primary_10_1063_1_1808058
crossref_primary_10_1088_0957_4484_26_18_185706
crossref_primary_10_1016_j_progpolymsci_2021_101420
crossref_primary_10_1103_PhysRevApplied_23_034065
crossref_primary_10_1109_TMECH_2014_2356719
crossref_primary_10_1016_j_apsusc_2022_155730
crossref_primary_10_1088_0957_4484_23_26_265705
crossref_primary_10_1063_1_3269703
crossref_primary_10_1039_C4CS00176A
crossref_primary_10_1088_0256_307X_28_4_043402
crossref_primary_10_1088_0957_4484_22_19_195702
crossref_primary_10_1088_1361_6439_ab4bad
crossref_primary_10_1109_JMEMS_2011_2127452
crossref_primary_10_1088_0957_4484_19_44_445717
crossref_primary_10_1007_s12213_017_0100_z
crossref_primary_10_1063_1_2767764
crossref_primary_10_1088_0957_4484_15_3_020
crossref_primary_10_1063_1_4769434
crossref_primary_10_1088_1674_1056_19_5_050701
crossref_primary_10_1109_JMEMS_2012_2235822
crossref_primary_10_1063_1_1777405
crossref_primary_10_1016_j_cocis_2016_10_002
crossref_primary_10_1016_j_ijnonlinmec_2019_01_006
crossref_primary_10_1007_s00424_007_0406_0
crossref_primary_10_1088_0957_0233_21_12_125502
crossref_primary_10_1016_j_ultramic_2012_05_009
crossref_primary_10_1063_1_3679683
crossref_primary_10_1109_TCST_2007_902959
crossref_primary_10_1063_1_4812979
crossref_primary_10_1002_smtd_202500723
crossref_primary_10_1088_0957_4484_18_6_065502
crossref_primary_10_1088_1361_6528_ab9390
crossref_primary_10_1088_0957_4484_17_21_033
crossref_primary_10_1073_pnas_0505628103
crossref_primary_10_1063_1_2767173
crossref_primary_10_1109_JMEMS_2015_2428677
crossref_primary_10_1063_1_3575321
crossref_primary_10_1038_s41596_018_0070_1
crossref_primary_10_1560_IJC_48_2_55
crossref_primary_10_1038_ncomms7270
crossref_primary_10_1038_nnano_2010_14
crossref_primary_10_1038_nnano_2012_38
crossref_primary_10_1038_natrevmats_2017_8
crossref_primary_10_1016_j_nantod_2025_102895
crossref_primary_10_1063_1_2980057
crossref_primary_10_1063_1_4755749
crossref_primary_10_1016_j_jsv_2012_07_014
crossref_primary_10_1063_1_2355437
crossref_primary_10_1063_1_2801009
crossref_primary_10_1016_j_apsusc_2020_147698
crossref_primary_10_1063_1_2345593
crossref_primary_10_1007_s11431_017_9161_4
crossref_primary_10_1002_smll_201101648
crossref_primary_10_1063_1_4927733
crossref_primary_10_1063_1_2959828
crossref_primary_10_1088_0957_4484_25_47_475701
crossref_primary_10_1088_0957_4484_18_18_185504
crossref_primary_10_1063_1_3309330
crossref_primary_10_1088_0957_4484_19_38_384011
crossref_primary_10_1016_S1369_7021_10_70162_0
crossref_primary_10_1088_0957_0233_22_9_094005
crossref_primary_10_1115_1_4001579
crossref_primary_10_1002_sca_21175
crossref_primary_10_1016_j_ultramic_2010_02_012
crossref_primary_10_1088_0957_4484_19_8_085704
crossref_primary_10_1088_0957_4484_26_23_235706
crossref_primary_10_1063_1_2907498
crossref_primary_10_1063_1_3692393
crossref_primary_10_1038_s41467_018_04887_1
crossref_primary_10_1063_1_4866664
crossref_primary_10_1088_1361_6528_aa5965
crossref_primary_10_1038_ncomms2365
crossref_primary_10_1063_1_3475644
crossref_primary_10_1063_1_1626008
crossref_primary_10_3762_bjnano_11_125
crossref_primary_10_1016_j_cpart_2006_12_005
crossref_primary_10_1016_j_micron_2018_12_007
crossref_primary_10_1063_1_2136430
crossref_primary_10_1088_0957_4484_17_7_S19
crossref_primary_10_1063_1_2783226
crossref_primary_10_1088_0957_4484_21_7_075702
crossref_primary_10_1063_1_2137887
crossref_primary_10_1063_1_1872202
crossref_primary_10_3762_bjnano_6_14
crossref_primary_10_1088_0957_4484_23_1_015706
crossref_primary_10_1063_1_3553852
crossref_primary_10_1063_1_3703767
crossref_primary_10_1016_S1748_0132_08_70012_4
crossref_primary_10_1088_0957_4484_20_24_245703
crossref_primary_10_1073_pnas_0902240106
crossref_primary_10_1016_j_progsurf_2008_09_001
crossref_primary_10_1038_nnano_2007_226
crossref_primary_10_1038_ncomms1246
crossref_primary_10_1063_5_0041366
crossref_primary_10_1007_s11071_012_0560_6
crossref_primary_10_3762_bjnano_6_229
crossref_primary_10_1088_0957_4484_21_46_465502
crossref_primary_10_1063_1_2909535
crossref_primary_10_1063_1_2940304
crossref_primary_10_1038_nmat1925
ContentType Journal Article
DBID CGR
CUY
CVF
ECM
EIF
NPM
7X8
DOI 10.1073/pnas.122040599
DatabaseName Medline
MEDLINE
MEDLINE (Ovid)
MEDLINE
MEDLINE
PubMed
MEDLINE - Academic
DatabaseTitle MEDLINE
Medline Complete
MEDLINE with Full Text
PubMed
MEDLINE (Ovid)
MEDLINE - Academic
DatabaseTitleList MEDLINE
MEDLINE - Academic
Database_xml – sequence: 1
  dbid: NPM
  name: PubMed
  url: http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed
  sourceTypes: Index Database
– sequence: 2
  dbid: 7X8
  name: MEDLINE - Academic
  url: https://search.proquest.com/medline
  sourceTypes: Aggregation Database
DeliveryMethod no_fulltext_linktorsrc
Discipline Sciences (General)
ExternalDocumentID 12070341
Genre Research Support, Non-U.S. Gov't
Journal Article
GroupedDBID ---
-DZ
-~X
.55
.GJ
0R~
123
29P
2AX
2FS
2WC
3O-
4.4
53G
5RE
5VS
85S
AACGO
AAFWJ
AANCE
AAYJJ
ABBHK
ABOCM
ABPLY
ABPPZ
ABTLG
ABXSQ
ABZEH
ACGOD
ACHIC
ACIWK
ACNCT
ACPRK
ADULT
AENEX
AEUPB
AEXZC
AFFNX
AFOSN
AFRAH
ALMA_UNASSIGNED_HOLDINGS
AQVQM
AS~
BKOMP
CGR
CS3
CUY
CVF
D0L
DCCCD
DIK
DOOOF
DU5
E3Z
EBS
ECM
EIF
EJD
F5P
FRP
GX1
H13
HGD
HH5
HQ3
HTVGU
HYE
IPSME
JAAYA
JBMMH
JENOY
JHFFW
JKQEH
JLS
JLXEF
JPM
JSG
JSODD
JST
KQ8
L7B
LU7
MVM
N9A
NEJ
NPM
N~3
O9-
OK1
P-O
PNE
PQQKQ
R.V
RHF
RHI
RNA
RNS
RPM
RXW
SA0
SJN
TAE
TN5
UKR
VOH
VQA
VXZ
W8F
WH7
WHG
WOQ
WOW
X7M
XSW
Y6R
YBH
YIF
YIN
YKV
YSK
ZCA
ZCG
~02
~KM
7X8
ADQXQ
ADXHL
ID FETCH-LOGICAL-c554t-3ca4bac9864ce00c75be01b412b94d1b5e3ba503f2ba33bcb3300ee8f12d9fef2
IEDL.DBID 7X8
ISICitedReferencesCount 176
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000176478200005&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN 0027-8424
IngestDate Sun Nov 09 09:50:07 EST 2025
Wed Feb 19 01:32:53 EST 2025
IsDoiOpenAccess false
IsOpenAccess true
IsPeerReviewed true
IsScholarly true
Issue 13
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c554t-3ca4bac9864ce00c75be01b412b94d1b5e3ba503f2ba33bcb3300ee8f12d9fef2
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
OpenAccessLink http://doi.org/10.1073/pnas.122040599
PMID 12070341
PQID 71860203
PQPubID 23479
ParticipantIDs proquest_miscellaneous_71860203
pubmed_primary_12070341
PublicationCentury 2000
PublicationDate 2002-06-25
PublicationDateYYYYMMDD 2002-06-25
PublicationDate_xml – month: 06
  year: 2002
  text: 2002-06-25
  day: 25
PublicationDecade 2000
PublicationPlace United States
PublicationPlace_xml – name: United States
PublicationTitle Proceedings of the National Academy of Sciences - PNAS
PublicationTitleAlternate Proc Natl Acad Sci U S A
PublicationYear 2002
References 10932247 - Nat Struct Biol. 2000 Aug;7(8):644-7
10692344 - Biophys J. 2000 Mar;78(3):1599-605
10033323 - Phys Rev Lett. 1986 Mar 3;56(9):930-933
10753119 - Science. 2000 Apr 7;288(5463):143-6
9083660 - Biophys J. 1997 Apr;72(4):1541-55
11283365 - Science. 2001 Mar 30;291(5513):2580-3
10073936 - Science. 1999 Mar 12;283(5408):1727-30
11340198 - Science. 2001 May 4;292(5518):905-8
11544521 - Nature. 2001 Sep 6;413(6851):51-4
11215624 - Ultramicroscopy. 2001 Jan;86(1-2):207-15
10058681 - Phys Rev Lett. 1995 Jun 19;74(25):5092-5095
References_xml – reference: 11283365 - Science. 2001 Mar 30;291(5513):2580-3
– reference: 10753119 - Science. 2000 Apr 7;288(5463):143-6
– reference: 10033323 - Phys Rev Lett. 1986 Mar 3;56(9):930-933
– reference: 11215624 - Ultramicroscopy. 2001 Jan;86(1-2):207-15
– reference: 11544521 - Nature. 2001 Sep 6;413(6851):51-4
– reference: 10932247 - Nat Struct Biol. 2000 Aug;7(8):644-7
– reference: 10692344 - Biophys J. 2000 Mar;78(3):1599-605
– reference: 10073936 - Science. 1999 Mar 12;283(5408):1727-30
– reference: 11340198 - Science. 2001 May 4;292(5518):905-8
– reference: 10058681 - Phys Rev Lett. 1995 Jun 19;74(25):5092-5095
– reference: 9083660 - Biophys J. 1997 Apr;72(4):1541-55
SSID ssj0009580
Score 2.1787157
Snippet Transient forces between nanoscale objects on surfaces govern friction, viscous flow, and plastic deformation, occur during manipulation of matter, or mediate...
SourceID proquest
pubmed
SourceType Aggregation Database
Index Database
StartPage 8473
SubjectTerms Microscopy, Atomic Force - methods
Surface Properties
Title Inverting dynamic force microscopy: from signals to time-resolved interaction forces
URI https://www.ncbi.nlm.nih.gov/pubmed/12070341
https://www.proquest.com/docview/71860203
Volume 99
WOSCitedRecordID wos000176478200005&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText
inHoldings 1
isFullTextHit
isPrint
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV09T8MwFLQKZWABymf59MAAg6ljO42NkBBCVCxUHYrUrbIdGyFBUppSiX-PXz4kJhhYImWwFD1dzpc8vzuEzm2QII4ZT7jyCREpE0SacCs8F155amNpy7CJZDiUk4katdBNMwsDxyobTiyJOs0t_CPvBQ7tQ9fsdvZBIDMKeqt1gMYKavMgZADTyUT-sNyV1QAKCzwsmGgsGxPem2W6uIoYCwiO1S_istxkBpv_e7wttFGLS3xXoaGDWi7bRp369S3wRe0xfbmDxuCvAQYCLzitMulxUK_W4Xc4oAejKl_XGEZPMBzwCBDFixxDDj0Jn-f529KlGIwm5tVYRLW22EXPg4fx_SOpAxaIDSpiQbjVwmgLDu3WUWqT2DgaGRExo0Qamdhxo2PKPTOac2MN55Q6J33EUuWdZ3toNcszd4Cwt4oryS3XjgsqlbRGmYQbIfs6UADrorOmbtMAYOhK6Mzln8W0qVwX7Veln84qn41pxICPRHT459ojtF6mtNA-YfExavtQF3eC1uxy8VrMT0tchOtw9PQNGS_Epw
linkProvider ProQuest
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Inverting+dynamic+force+microscopy%3A+from+signals+to+time-resolved+interaction+forces&rft.jtitle=Proceedings+of+the+National+Academy+of+Sciences+-+PNAS&rft.au=Stark%2C+Martin&rft.au=Stark%2C+Robert+W&rft.au=Heckl%2C+Wolfgang+M&rft.au=Guckenberger%2C+Reinhard&rft.date=2002-06-25&rft.issn=0027-8424&rft.volume=99&rft.issue=13&rft.spage=8473&rft_id=info:doi/10.1073%2Fpnas.122040599&rft.externalDBID=NO_FULL_TEXT
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0027-8424&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0027-8424&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0027-8424&client=summon