Degradation modeling and remaining useful life prediction for electronic device under multiple stress influences

Power driver devices have functions such as current amplification and power conversion, making them key components of electronic systems. Their degradation is affected by multiple types of stress, making it difficult to establish an accurate degradation model. To monitor the degradation state of ele...

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Bibliographic Details
Published in:Scientific reports Vol. 15; no. 1; pp. 19117 - 16
Main Authors: Li, Changjun, Cheng, Jinjun, Zhu, Haizhen, Wen, Bincheng, Zhao, Xin, Kang, Weijie
Format: Journal Article
Language:English
Published: London Nature Publishing Group UK 31.05.2025
Nature Publishing Group
Nature Portfolio
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ISSN:2045-2322, 2045-2322
Online Access:Get full text
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